/dev/ada0 smartctl 7.4 2023-08-01 r5530 [FreeBSD 14.1-RELEASE-p6 amd64] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 860 EVO 250GB Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: RVT01B6Q User Capacity: 250,059,350,016 bytes [250 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: In smartctl database 7.3/5528 ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Fri Jan 17 09:27:14 2025 MST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 85) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 097 097 000 - 14269 12 Power_Cycle_Count -O--CK 099 099 000 - 398 177 Wear_Leveling_Count PO--C- 099 099 000 - 18 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 100 100 010 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O--CK 090 049 000 - 10 195 ECC_Error_Rate -O-RC- 200 200 000 - 0 199 CRC_Error_Count -OSRCK 100 100 000 - 0 235 POR_Recovery_Count -O--C- 099 099 000 - 218 241 Total_LBAs_Written -O--CK 099 099 000 - 9017819037 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x13 GPL R/O 1 SATA NCQ Send and Receive log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 SL VS 16 Device vendor specific log 0xa5 SL VS 16 Device vendor specific log 0xce-0xcf SL VS 16 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) Device State: Active (0) Current Temperature: 10 Celsius Power Cycle Min/Max Temperature: 10/40 Celsius Lifetime Min/Max Temperature: -2/51 Celsius Specified Max Operating Temperature: 70 Celsius Under/Over Temperature Limit Count: 0/0 SMART Status: 0xc24f (PASSED) SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: 0/70 Celsius Temperature History Size (Index): 128 (45) Index Estimated Time Temperature Celsius 46 2025-01-16 12:10 32 ************* 47 2025-01-16 12:20 31 ************ 48 2025-01-16 12:30 31 ************ 49 2025-01-16 12:40 31 ************ 50 2025-01-16 12:50 32 ************* ... ..( 4 skipped). .. ************* 55 2025-01-16 13:40 32 ************* 56 2025-01-16 13:50 31 ************ ... ..( 7 skipped). .. ************ 64 2025-01-16 15:10 31 ************ 65 2025-01-16 15:20 30 *********** ... ..( 2 skipped). .. *********** 68 2025-01-16 15:50 30 *********** 69 2025-01-16 16:00 29 ********** ... ..( 4 skipped). .. ********** 74 2025-01-16 16:50 29 ********** 75 2025-01-16 17:00 30 *********** ... ..( 6 skipped). .. *********** 82 2025-01-16 18:10 30 *********** 83 2025-01-16 18:20 29 ********** ... ..( 3 skipped). .. ********** 87 2025-01-16 19:00 29 ********** 88 2025-01-16 19:10 28 ********* 89 2025-01-16 19:20 28 ********* 90 2025-01-16 19:30 28 ********* 91 2025-01-16 19:40 27 ******** 92 2025-01-16 19:50 27 ******** 93 2025-01-16 20:00 26 ******* 94 2025-01-16 20:10 26 ******* 95 2025-01-16 20:20 26 ******* 96 2025-01-16 20:30 25 ****** 97 2025-01-16 20:40 25 ****** 98 2025-01-16 20:50 25 ****** 99 2025-01-16 21:00 24 ***** ... ..( 2 skipped). .. ***** 102 2025-01-16 21:30 24 ***** 103 2025-01-16 21:40 23 **** ... ..( 2 skipped). .. **** 106 2025-01-16 22:10 23 **** 107 2025-01-16 22:20 22 *** ... ..( 4 skipped). .. *** 112 2025-01-16 23:10 22 *** 113 2025-01-16 23:20 21 ** ... ..( 4 skipped). .. ** 118 2025-01-17 00:10 21 ** 119 2025-01-17 00:20 20 * ... ..( 4 skipped). .. * 124 2025-01-17 01:10 20 * 125 2025-01-17 01:20 19 - 126 2025-01-17 01:30 19 - 127 2025-01-17 01:40 20 * ... ..( 2 skipped). .. * 2 2025-01-17 02:10 20 * 3 2025-01-17 02:20 19 - ... ..( 2 skipped). .. - 6 2025-01-17 02:50 19 - 7 2025-01-17 03:00 20 * ... ..( 21 skipped). .. * 29 2025-01-17 06:40 20 * 30 2025-01-17 06:50 ? - ... ..( 11 skipped). .. - 42 2025-01-17 08:50 ? - 43 2025-01-17 09:00 10 - 44 2025-01-17 09:10 13 - 45 2025-01-17 09:20 15 - SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 398 --- Lifetime Power-On Resets 0x01 0x010 4 14269 --- Power-on Hours 0x01 0x018 6 9017819037 --- Logical Sectors Written 0x01 0x020 6 167336950 --- Number of Write Commands 0x01 0x028 6 6933512359 --- Logical Sectors Read 0x01 0x030 6 90300143 --- Number of Read Commands 0x01 0x038 6 878000 --- Date and Time TimeStamp 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 3 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 10 --- Current Temperature 0x05 0x020 1 51 --- Highest Temperature 0x05 0x028 1 -2 --- Lowest Temperature 0x05 0x058 1 70 --- Specified Maximum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 2137 --- Number of Hardware Resets 0x06 0x010 4 0 --- Number of ASR Events 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 1 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 7 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 7 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC