Probe #ed2bf7c3ef of Lenovo 312D SDK0J40697 WIN ... (ThinkCentre M720q 10T8S1ST0X)

Log: smartctl

/dev/ada0 smartctl 7.5 2025-04-30 r5714 [FreeBSD 14.3-RELEASE-p2 amd64] (local build) Copyright (C) 2002-25, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: SAMSUNG MZ7LN256HAJQ-000L7 Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: MVT04L6Q User Capacity: 256,060,514,304 bytes [256 GB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available Device is: In smartctl database 7.5/5706 ATA Version is: ACS-3, ATA8-ACS T13/1699-D revision 4c SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Fri Sep 26 05:09:30 2025 EEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x80) Offline data collection activity was never started. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 85) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 095 095 000 - 22365 12 Power_Cycle_Count -O--CK 098 098 000 - 1095 170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0 171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0 172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0 173 Wear_Leveling_Count PO--CK 088 088 005 - 146 174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 95 178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0 180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 635 184 End-to-End_Error PO--CK 100 100 097 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 194 Temperature_Celsius -O--CK 053 038 000 - 47 (Min/Max 15/62) 199 CRC_Error_Count -OSRCK 100 100 000 - 0 233 Media_Wearout_Indicator PO--C- 087 087 001 - 14735987 234 Unknown_Samsung_Attr -O--CK 100 100 000 - 0 241 Total_LBAs_Written -O--CK 099 099 000 - 25240 242 Total_LBAs_Read -O--CK 099 099 000 - 33086 249 NAND_Writes_1GiB -O--CK 099 099 000 - 71597 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x13 GPL R/O 1 SATA NCQ Send and Receive log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa5 SL VS 16 Device vendor specific log 0xce SL VS 16 Device vendor specific log 0xdf GPL,SL VS 1 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 255 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) Device State: Active (0) Current Temperature: 47 Celsius Power Cycle Min/Max Temperature: ?/47 Celsius Lifetime Min/Max Temperature: 23/62 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: 0/70 Celsius Temperature History Size (Index): 128 (5) Index Estimated Time Temperature Celsius 6 2025-09-25 07:50 48 ***************************** ... ..( 6 skipped). .. ***************************** 13 2025-09-25 09:00 48 ***************************** 14 2025-09-25 09:10 49 ****************************** 15 2025-09-25 09:20 48 ***************************** ... ..( 26 skipped). .. ***************************** 42 2025-09-25 13:50 48 ***************************** 43 2025-09-25 14:00 49 ****************************** 44 2025-09-25 14:10 48 ***************************** ... ..( 7 skipped). .. ***************************** 52 2025-09-25 15:30 48 ***************************** 53 2025-09-25 15:40 49 ****************************** 54 2025-09-25 15:50 48 ***************************** ... ..( 28 skipped). .. ***************************** 83 2025-09-25 20:40 48 ***************************** 84 2025-09-25 20:50 47 **************************** 85 2025-09-25 21:00 48 ***************************** 86 2025-09-25 21:10 47 **************************** ... ..( 5 skipped). .. **************************** 92 2025-09-25 22:10 47 **************************** 93 2025-09-25 22:20 46 *************************** 94 2025-09-25 22:30 46 *************************** 95 2025-09-25 22:40 47 **************************** 96 2025-09-25 22:50 46 *************************** 97 2025-09-25 23:00 46 *************************** 98 2025-09-25 23:10 46 *************************** 99 2025-09-25 23:20 47 **************************** 100 2025-09-25 23:30 46 *************************** 101 2025-09-25 23:40 46 *************************** 102 2025-09-25 23:50 47 **************************** 103 2025-09-26 00:00 47 **************************** 104 2025-09-26 00:10 48 ***************************** ... ..( 6 skipped). .. ***************************** 111 2025-09-26 01:20 48 ***************************** 112 2025-09-26 01:30 49 ****************************** 113 2025-09-26 01:40 48 ***************************** ... ..( 3 skipped). .. ***************************** 117 2025-09-26 02:20 48 ***************************** 118 2025-09-26 02:30 49 ****************************** 119 2025-09-26 02:40 48 ***************************** ... ..( 9 skipped). .. ***************************** 1 2025-09-26 04:20 48 ***************************** 2 2025-09-26 04:30 ? - 3 2025-09-26 04:40 ? - 4 2025-09-26 04:50 47 **************************** 5 2025-09-26 05:00 47 **************************** SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 1095 --- Lifetime Power-On Resets 0x01 0x010 4 22365 --- Power-on Hours 0x01 0x018 6 52932301076 --- Logical Sectors Written 0x01 0x020 6 0 --- Number of Write Commands 0x01 0x028 6 69388062958 --- Logical Sectors Read 0x01 0x030 6 0 --- Number of Read Commands 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 469 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 47 --- Current Temperature 0x05 0x020 1 62 --- Highest Temperature 0x05 0x028 1 23 --- Lowest Temperature 0x05 0x058 1 55 --- Specified Maximum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 3242 --- Number of Hardware Resets 0x06 0x010 4 0 --- Number of ASR Events 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 12 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 2 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 2 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC


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