/dev/sd0 smartctl 7.3 2022-02-28 r5338 [OpenBSD 7.3 amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Hitachi Travelstar 5K500.B Device Model: Hitachi HTS545016B9A300 Serial Number: -- LU WWN Device Id: 5 000cca ... Firmware Version: PBBOC64G User Capacity: 160,041,885,696 bytes [160 GB] Sector Size: 512 bytes logical/physical Rotation Rate: 5400 rpm Form Factor: 2.5 inches Device is: In smartctl database 7.3/5319 ATA Version is: ATA8-ACS T13/1699-D revision 6 SATA Version is: SATA 2.6, 3.0 Gb/s Local Time is: Sat May 6 21:40:10 2023 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART Status not supported: Incomplete response, ATA output registers missing SMART overall-health self-assessment test result: PASSED Warning: This result is based on an Attribute check. General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 645) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 65) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 062 Pre-fail Always - 0 2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0 3 Spin_Up_Time 0x0007 238 238 033 Pre-fail Always - 1 4 Start_Stop_Count 0x0012 098 098 000 Old_age Always - 4274 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0 7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0 9 Power_On_Hours 0x0012 098 098 000 Old_age Always - 1071 10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 1679 191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 0 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 76 193 Load_Cycle_Count 0x0012 097 097 000 Old_age Always - 39057 194 Temperature_Celsius 0x0002 152 152 000 Old_age Always - 36 (Min/Max 12/49) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0 223 Load_Retry_Count 0x000a 100 100 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 1 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 01 af 9e a1 e2 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 37 ff 01 af 9e a1 e2 00 00:00:14.300 SET NATIVE MAX ADDRESS EXT [OBS-ACS-3] 27 ff 00 ff 4f c2 e0 00 00:00:14.300 READ NATIVE MAX ADDRESS EXT [OBS-ACS-3] b0 da 00 ff 4f c2 e0 00 00:00:14.300 SMART RETURN STATUS ef 03 46 ff 4f c2 e0 00 00:00:08.400 SET FEATURES [Set transfer mode] ef 03 0c ff 4f c2 e0 00 00:00:08.400 SET FEATURES [Set transfer mode] SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. /dev/sd1 smartctl 7.3 2022-02-28 r5338 [OpenBSD 7.3 amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Vendor: OPENBSD Product: SR CRYPTO Revision: 006 User Capacity: 160,041,582,592 bytes [160 GB] Logical block size: 512 bytes >> Terminate command early due to bad response to IEC mode page A mandatory SMART command failed: exiting. To continue, add one or more '-T permissive' options.