/dev/sd0 smartctl 7.3 2022-02-28 r5338 [OpenBSD 7.3 amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: TOSHIBA KSG60ZMV256G M.2 2280 256GB Serial Number: -- LU WWN Device Id: 5 00080d ... Firmware Version: ABDA4102 User Capacity: 256,060,514,304 bytes [256 GB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: Solid State Device Form Factor: M.2 TRIM Command: Available, deterministic, zeroed Device is: Not in smartctl database 7.3/5319 ATA Version is: ACS-4 (minor revision not indicated) SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sun Aug 27 02:41:25 2023 MDT SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART Status not supported: Incomplete response, ATA output registers missing SMART overall-health self-assessment test result: PASSED Warning: This result is based on an Attribute check. General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 11) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 2694 12 Power_Cycle_Count 0x0033 100 100 000 Pre-fail Always - 752 166 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0 167 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 0 168 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0 173 Unknown_Attribute 0x0012 183 183 000 Old_age Always - 0 175 Program_Fail_Count_Chip 0x0033 100 100 010 Pre-fail Always - 0 176 Erase_Fail_Count_Chip 0x0033 100 100 010 Pre-fail Always - 0 177 Wear_Leveling_Count 0x0033 083 083 010 Pre-fail Always - 0 178 Used_Rsvd_Blk_Cnt_Chip 0x0033 100 100 010 Pre-fail Always - 0 179 Used_Rsvd_Blk_Cnt_Tot 0x0033 100 100 010 Pre-fail Always - 0 180 Unused_Rsvd_Blk_Cnt_Tot 0x0033 100 100 010 Pre-fail Always - 100 181 Program_Fail_Cnt_Total 0x0033 100 100 010 Pre-fail Always - 100 182 Erase_Fail_Count_Total 0x0033 100 100 010 Pre-fail Always - 100 187 Reported_Uncorrect 0x0033 100 100 000 Pre-fail Always - 0 192 Power-Off_Retract_Count 0x0012 100 100 000 Old_age Always - 129 194 Temperature_Celsius 0x0022 048 038 000 Old_age Always - 52 (Min/Max 11/62) 195 Hardware_ECC_Recovered 0x002b 100 100 000 Pre-fail Always - 0 199 UDMA_CRC_Error_Count 0x0012 100 100 000 Old_age Always - 0 238 Unknown_Attribute 0x0032 083 083 010 Old_age Always - 0 241 Total_LBAs_Written 0x0013 100 100 000 Pre-fail Always - 218132 242 Total_LBAs_Read 0x0013 100 100 000 Pre-fail Always - 154707 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 0 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.