/dev/ada0 smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.0-STABLE amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: SAMSUNG MZYTE256HMHP-000L2 Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: EXT06L0Q User Capacity: 256,060,514,304 bytes [256 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device TRIM Command: Available Device is: Not in smartctl database 7.3/5319 ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Thu Apr 7 10:19:09 2022 AEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Unexpected SCT status 0x0001 (action_code=4, function_code=2) Wt Cache Reorder: Unknown (SCT Feature Control command failed) === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED See vendor-specific Attribute list for marginal Attributes. General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 80) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 9 Power_On_Hours -O--CK 099 099 000 - 1976 12 Power_Cycle_Count -O--CK 098 098 000 - 1986 175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0 176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0 177 Wear_Leveling_Count PO--C- 095 095 005 - 52 178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 4335 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 100 001 010 Past 0 184 End-to-End_Error PO--CK 100 100 097 - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O--CK 064 051 000 - 36 195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0 198 Offline_Uncorrectable ----CK 100 100 000 - 0 199 UDMA_CRC_Error_Count -OSRCK 100 100 000 - 2 233 Media_Wearout_Indicator -O-RCK 199 199 000 - 1421 234 Unknown_Attribute -O--C- 100 100 000 - 0 235 Unknown_Attribute -O--C- 099 099 000 - 94 236 Unknown_Attribute -O--C- 099 099 000 - 17 237 Unknown_Attribute -O--C- 099 099 000 - 52 238 Unknown_Attribute -O--C- 100 100 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xdf GPL,SL VS 1 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 0 - # 2 Short offline Completed without error 00% 0 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 1 (0x0001) Device State: Active (0) Current Temperature: 36 Celsius Power Cycle Min/Max Temperature: ?/ ? Celsius Lifetime Min/Max Temperature: ?/ ? Celsius Under/Over Temperature Limit Count: 0/11884 SCT Temperature History Version: 2 Temperature Sampling Period: 10 minutes Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: ?/ ? Celsius Min/Max Temperature Limit: ?/ ? Celsius Temperature History Size (Index): 128 (28) Index Estimated Time Temperature Celsius 29 2022-04-06 13:00 37 ****************** 30 2022-04-06 13:10 38 ******************* ... ..( 2 skipped). .. ******************* 33 2022-04-06 13:40 38 ******************* 34 2022-04-06 13:50 39 ******************** 35 2022-04-06 14:00 38 ******************* 36 2022-04-06 14:10 38 ******************* 37 2022-04-06 14:20 38 ******************* 38 2022-04-06 14:30 37 ****************** ... ..( 5 skipped). .. ****************** 44 2022-04-06 15:30 37 ****************** 45 2022-04-06 15:40 36 ***************** 46 2022-04-06 15:50 36 ***************** 47 2022-04-06 16:00 36 ***************** 48 2022-04-06 16:10 37 ****************** 49 2022-04-06 16:20 36 ***************** ... ..( 24 skipped). .. ***************** 74 2022-04-06 20:30 36 ***************** 75 2022-04-06 20:40 35 **************** 76 2022-04-06 20:50 36 ***************** 77 2022-04-06 21:00 35 **************** ... ..( 77 skipped). .. **************** 27 2022-04-07 10:00 35 **************** 28 2022-04-07 10:10 36 ***************** SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 21 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 21 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC