/dev/ada0 smartctl 7.4 2023-08-01 r5530 [FreeBSD 14.1-RELEASE-p3 amd64] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 870 EVO 1TB Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: SVT01B6Q User Capacity: 1,000,204,886,016 bytes [1.00 TB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: In smartctl database 7.3/5528 ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sat Aug 24 16:13:44 2024 PDT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 85) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 084 084 010 - 181 9 Power_On_Hours -O--CK 097 097 000 - 12814 12 Power_Cycle_Count -O--CK 098 098 000 - 1676 177 Wear_Leveling_Count PO--C- 098 098 000 - 41 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 084 084 010 - 181 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 084 084 010 - 181 187 Uncorrectable_Error_Cnt -O--CK 099 099 000 - 205 190 Airflow_Temperature_Cel -O--CK 073 057 000 - 27 195 ECC_Error_Rate -O-RC- 199 199 000 - 205 199 CRC_Error_Count -OSRCK 100 100 000 - 0 235 POR_Recovery_Count -O--C- 099 099 000 - 616 241 Total_LBAs_Written -O--CK 099 099 000 - 54460215696 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x13 GPL R/O 1 SATA NCQ Send and Receive log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 SL VS 16 Device vendor specific log 0xa5 SL VS 16 Device vendor specific log 0xce SL VS 16 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) Device Error Count: 255 (device log contains only the most recent 4 errors) CR = Command Register FEATR = Features Register COUNT = Count (was: Sector Count) Register LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8 LH = LBA High (was: Cylinder High) Register ] LBA LM = LBA Mid (was: Cylinder Low) Register ] Register LL = LBA Low (was: Sector Number) Register ] DV = Device (was: Device/Head) Register DC = Device Control Register ER = Error register ST = Status register Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 255 [2] occurred at disk power-on lifetime: 12125 hours (505 days + 5 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 00 -- 51 00 00 00 00 34 34 b0 80 40 00 Error: at LBA = 0x3434b080 = 875868288 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 60 00 a0 00 f0 00 00 53 4f 17 00 40 1e 03:19:10.696 READ FPDMA QUEUED 60 00 a0 00 e8 00 00 53 4f 18 00 40 1d 03:19:10.696 READ FPDMA QUEUED 60 00 a0 00 b8 00 00 53 4f 19 00 40 17 03:19:10.696 READ FPDMA QUEUED 60 00 a0 00 98 00 00 53 4f 1a 00 40 13 03:19:10.696 READ FPDMA QUEUED 60 01 60 00 90 00 00 53 4f 1a a0 40 12 03:19:10.696 READ FPDMA QUEUED Error 254 [1] occurred at disk power-on lifetime: 12124 hours (505 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 40 -- 51 00 58 00 00 53 4f 19 80 40 00 Error: UNC at LBA = 0x534f1980 = 1397692800 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 60 00 80 00 58 00 00 53 4f 19 80 40 0b 02:31:12.793 READ FPDMA QUEUED 61 00 08 00 48 00 00 64 48 51 38 40 09 02:31:12.793 WRITE FPDMA QUEUED 60 00 18 00 b0 00 00 3b 56 c5 d8 40 16 02:31:12.793 READ FPDMA QUEUED 60 00 48 00 78 00 00 45 92 95 b8 40 0f 02:31:12.793 READ FPDMA QUEUED 60 00 10 00 70 00 00 45 92 95 88 40 0e 02:31:12.793 READ FPDMA QUEUED Error 253 [0] occurred at disk power-on lifetime: 12124 hours (505 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 40 -- 51 00 40 00 00 53 4f 22 80 40 00 Error: UNC at LBA = 0x534f2280 = 1397695104 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 60 00 80 00 40 00 00 53 4f 22 80 40 08 02:10:15.401 READ FPDMA QUEUED 47 00 00 00 01 00 00 00 00 00 00 40 07 02:10:15.401 READ LOG DMA EXT 47 00 00 00 01 00 00 00 00 06 30 40 07 02:10:15.401 READ LOG DMA EXT 47 00 00 00 01 00 00 00 00 00 30 40 07 02:10:15.401 READ LOG DMA EXT 47 00 00 00 01 00 00 00 00 00 00 40 07 02:10:15.401 READ LOG DMA EXT Error 252 [3] occurred at disk power-on lifetime: 12124 hours (505 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 40 -- 51 00 38 00 00 53 4f 22 80 40 00 Error: UNC at LBA = 0x534f2280 = 1397695104 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 60 00 80 00 38 00 00 53 4f 22 80 40 07 02:10:15.226 READ FPDMA QUEUED 47 00 00 00 01 00 00 00 00 00 00 40 0f 02:10:15.226 READ LOG DMA EXT 47 00 00 00 01 00 00 00 00 06 30 40 0f 02:10:15.226 READ LOG DMA EXT 47 00 00 00 01 00 00 00 00 00 30 40 0f 02:10:15.226 READ LOG DMA EXT 47 00 00 00 01 00 00 00 00 00 00 40 0f 02:10:15.226 READ LOG DMA EXT SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 256 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) Device State: Active (0) Current Temperature: 27 Celsius Power Cycle Min/Max Temperature: 26/40 Celsius Lifetime Min/Max Temperature: 12/43 Celsius Specified Max Operating Temperature: 70 Celsius Under/Over Temperature Limit Count: 0/0 SMART Status: 0xc24f (PASSED) SCT Temperature History Version: 2 Temperature Sampling Period: 10 minutes Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: 0/70 Celsius Temperature History Size (Index): 128 (87) Index Estimated Time Temperature Celsius 88 2024-08-23 19:00 27 ******** 89 2024-08-23 19:10 28 ********* 90 2024-08-23 19:20 26 ******* 91 2024-08-23 19:30 27 ******** ... ..( 2 skipped). .. ******** 94 2024-08-23 20:00 27 ******** 95 2024-08-23 20:10 25 ****** 96 2024-08-23 20:20 26 ******* 97 2024-08-23 20:30 27 ******** ... ..( 5 skipped). .. ******** 103 2024-08-23 21:30 27 ******** 104 2024-08-23 21:40 26 ******* 105 2024-08-23 21:50 27 ******** 106 2024-08-23 22:00 27 ******** 107 2024-08-23 22:10 25 ****** 108 2024-08-23 22:20 26 ******* 109 2024-08-23 22:30 28 ********* 110 2024-08-23 22:40 27 ******** 111 2024-08-23 22:50 28 ********* 112 2024-08-23 23:00 25 ****** 113 2024-08-23 23:10 27 ******** 114 2024-08-23 23:20 27 ******** 115 2024-08-23 23:30 28 ********* 116 2024-08-23 23:40 27 ******** 117 2024-08-23 23:50 27 ******** 118 2024-08-24 00:00 27 ******** 119 2024-08-24 00:10 26 ******* 120 2024-08-24 00:20 24 ***** 121 2024-08-24 00:30 24 ***** 122 2024-08-24 00:40 25 ****** 123 2024-08-24 00:50 25 ****** 124 2024-08-24 01:00 26 ******* ... ..( 18 skipped). .. ******* 15 2024-08-24 04:10 26 ******* 16 2024-08-24 04:20 25 ****** 17 2024-08-24 04:30 26 ******* 18 2024-08-24 04:40 25 ****** ... ..( 22 skipped). .. ****** 41 2024-08-24 08:30 25 ****** 42 2024-08-24 08:40 26 ******* 43 2024-08-24 08:50 25 ****** ... ..( 2 skipped). .. ****** 46 2024-08-24 09:20 25 ****** 47 2024-08-24 09:30 26 ******* ... ..( 6 skipped). .. ******* 54 2024-08-24 10:40 26 ******* 55 2024-08-24 10:50 27 ******** 56 2024-08-24 11:00 26 ******* 57 2024-08-24 11:10 27 ******** 58 2024-08-24 11:20 27 ******** 59 2024-08-24 11:30 27 ******** 60 2024-08-24 11:40 ? - 61 2024-08-24 11:50 27 ******** 62 2024-08-24 12:00 27 ******** 63 2024-08-24 12:10 27 ******** 64 2024-08-24 12:20 ? - 65 2024-08-24 12:30 27 ******** 66 2024-08-24 12:40 27 ******** 67 2024-08-24 12:50 28 ********* 68 2024-08-24 13:00 27 ******** 69 2024-08-24 13:10 ? - 70 2024-08-24 13:20 26 ******* 71 2024-08-24 13:30 26 ******* 72 2024-08-24 13:40 26 ******* 73 2024-08-24 13:50 27 ******** 74 2024-08-24 14:00 27 ******** 75 2024-08-24 14:10 27 ******** 76 2024-08-24 14:20 29 ********** 77 2024-08-24 14:30 27 ******** ... ..( 9 skipped). .. ******** 87 2024-08-24 16:10 27 ******** SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 1676 --- Lifetime Power-On Resets 0x01 0x010 4 12814 --- Power-on Hours 0x01 0x018 6 54460215696 --- Logical Sectors Written 0x01 0x020 6 359676149 --- Number of Write Commands 0x01 0x028 6 31923900329 --- Logical Sectors Read 0x01 0x030 6 204718072 --- Number of Read Commands 0x01 0x038 6 2484000 --- Date and Time TimeStamp 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 205 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 27 --- Current Temperature 0x05 0x020 1 43 --- Highest Temperature 0x05 0x028 1 12 --- Lowest Temperature 0x05 0x058 1 70 --- Specified Maximum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 17682 --- Number of Hardware Resets 0x06 0x010 4 0 --- Number of ASR Events 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 1 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 12 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 12 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC