/dev/sd0 smartctl 7.4 2023-08-01 r5530 [OpenBSD 7.5 amd64] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 870 EVO 250GB Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: SVT02B6Q User Capacity: 250,059,350,016 bytes [250 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: In smartctl database 7.3/5528 ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sun Apr 7 20:29:01 2024 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART Status not supported: Incomplete response, ATA output registers missing SMART overall-health self-assessment test result: PASSED Warning: This result is based on an Attribute check. General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 85) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0 9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 1 12 Power_Cycle_Count 0x0032 099 099 000 Old_age Always - 3 177 Wear_Leveling_Count 0x0013 100 100 000 Pre-fail Always - 0 179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0 181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0 182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0 183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0 187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0 190 Airflow_Temperature_Cel 0x0032 070 048 000 Old_age Always - 30 195 ECC_Error_Rate 0x001a 200 200 000 Old_age Always - 0 199 CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0 235 POR_Recovery_Count 0x0012 100 100 000 Old_age Always - 0 241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 35486239 252 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 256 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. The above only provides legacy SMART information - try 'smartctl -x' for more /dev/sd1 smartctl 7.4 2023-08-01 r5530 [OpenBSD 7.5 amd64] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Vendor: NVMe Product: INTEL MEMPEK1W01 Revision: K311 Compliance: SPC-4 User Capacity: 14,403,239,936 bytes [14.4 GB] Logical block size: 512 bytes >> Terminate command early due to bad response to IEC mode page A mandatory SMART command failed: exiting. To continue, add one or more '-T permissive' options.