/dev/ada0 smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.1-RELEASE-p18-HBSD amd64] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 840 EVO 120GB Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: EXT0BB0Q User Capacity: 120,034,123,776 bytes [120 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device TRIM Command: Available Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s) Local Time is: Sun Jun 27 08:06:54 2021 EDT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Unexpected SCT status 0x0001 (action_code=4, function_code=2) Wt Cache Reorder: Unknown (SCT Feature Control command failed) === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 4200) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 70) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 084 084 000 - 78882 12 Power_Cycle_Count -O--CK 099 099 000 - 207 177 Wear_Leveling_Count PO--C- 095 095 000 - 55 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 100 100 010 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O--CK 068 060 000 - 32 195 ECC_Error_Rate -O-RC- 200 200 000 - 0 199 CRC_Error_Count -OSRCK 100 100 000 - 0 235 POR_Recovery_Count -O--C- 099 099 000 - 144 241 Total_LBAs_Written -O--CK 099 099 000 - 27365437321 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 GPL,SL VS 16 Device vendor specific log 0xce GPL,SL VS 16 Device vendor specific log SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 1 (0x0001) Device State: Active (0) Current Temperature: 32 Celsius Power Cycle Min/Max Temperature: ?/ ? Celsius Lifetime Min/Max Temperature: ?/ ? Celsius Under/Over Temperature Limit Count: 0/390765 SCT Temperature History Version: 2 Temperature Sampling Period: 10 minutes Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: ?/ ? Celsius Min/Max Temperature Limit: ?/ ? Celsius Temperature History Size (Index): 128 (61) Index Estimated Time Temperature Celsius 62 2021-06-26 10:50 ? - ... ..( 65 skipped). .. - 0 2021-06-26 21:50 ? - 1 2021-06-26 22:00 30 *********** 2 2021-06-26 22:10 29 ********** 3 2021-06-26 22:20 28 ********* 4 2021-06-26 22:30 27 ******** 5 2021-06-26 22:40 28 ********* ... ..( 2 skipped). .. ********* 8 2021-06-26 23:10 28 ********* 9 2021-06-26 23:20 27 ******** 10 2021-06-26 23:30 28 ********* 11 2021-06-26 23:40 28 ********* 12 2021-06-26 23:50 28 ********* 13 2021-06-27 00:00 27 ******** 14 2021-06-27 00:10 28 ********* 15 2021-06-27 00:20 29 ********** ... ..( 3 skipped). .. ********** 19 2021-06-27 01:00 29 ********** 20 2021-06-27 01:10 30 *********** 21 2021-06-27 01:20 30 *********** 22 2021-06-27 01:30 29 ********** 23 2021-06-27 01:40 30 *********** ... ..( 2 skipped). .. *********** 26 2021-06-27 02:10 30 *********** 27 2021-06-27 02:20 31 ************ 28 2021-06-27 02:30 30 *********** 29 2021-06-27 02:40 31 ************ ... ..( 7 skipped). .. ************ 37 2021-06-27 04:00 31 ************ 38 2021-06-27 04:10 32 ************* 39 2021-06-27 04:20 32 ************* 40 2021-06-27 04:30 31 ************ 41 2021-06-27 04:40 31 ************ 42 2021-06-27 04:50 31 ************ 43 2021-06-27 05:00 32 ************* 44 2021-06-27 05:10 32 ************* 45 2021-06-27 05:20 31 ************ 46 2021-06-27 05:30 31 ************ 47 2021-06-27 05:40 32 ************* 48 2021-06-27 05:50 32 ************* 49 2021-06-27 06:00 31 ************ 50 2021-06-27 06:10 31 ************ 51 2021-06-27 06:20 32 ************* 52 2021-06-27 06:30 32 ************* 53 2021-06-27 06:40 32 ************* 54 2021-06-27 06:50 35 **************** 55 2021-06-27 07:00 36 ***************** 56 2021-06-27 07:10 36 ***************** 57 2021-06-27 07:20 35 **************** 58 2021-06-27 07:30 34 *************** 59 2021-06-27 07:40 34 *************** 60 2021-06-27 07:50 34 *************** 61 2021-06-27 08:00 31 ************ SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 3 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC