/dev/ada0 smartctl 7.2 2021-09-14 r5236 [FreeBSD 12.1-RELEASE-p21-HBSD amd64] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 840 EVO 250GB Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: EXT0CB6Q User Capacity: 250,059,350,016 bytes [250 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device TRIM Command: Available Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c SATA Version is: SATA 3.1, 6.0 Gb/s (current: 3.0 Gb/s) Local Time is: Tue Nov 30 01:29:50 2021 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Unexpected SCT status 0x0001 (action_code=4, function_code=2) Wt Cache Reorder: Unknown (SCT Feature Control command failed) === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 4800) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 80) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 096 096 000 - 17298 12 Power_Cycle_Count -O--CK 093 093 000 - 6668 177 Wear_Leveling_Count PO--C- 097 097 000 - 30 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 100 100 010 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O--CK 069 046 000 - 31 195 ECC_Error_Rate -O-RC- 200 200 000 - 0 199 CRC_Error_Count -OSRCK 099 099 000 - 1 235 POR_Recovery_Count -O--C- 099 099 000 - 288 241 Total_LBAs_Written -O--CK 099 099 000 - 12173580495 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 GPL,SL VS 16 Device vendor specific log 0xce GPL,SL VS 16 Device vendor specific log 0xde SL VS 1 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 1 (0x0001) Device State: Active (0) Current Temperature: 31 Celsius Power Cycle Min/Max Temperature: ?/ ? Celsius Lifetime Min/Max Temperature: ?/ ? Celsius Under/Over Temperature Limit Count: 0/103630 SCT Temperature History Version: 2 Temperature Sampling Period: 10 minutes Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: ?/ ? Celsius Min/Max Temperature Limit: ?/ ? Celsius Temperature History Size (Index): 128 (26) Index Estimated Time Temperature Celsius 27 2021-11-29 04:10 ? - ... ..(100 skipped). .. - 0 2021-11-29 21:00 ? - 1 2021-11-29 21:10 25 ****** 2 2021-11-29 21:20 26 ******* 3 2021-11-29 21:30 28 ********* 4 2021-11-29 21:40 34 *************** 5 2021-11-29 21:50 33 ************** 6 2021-11-29 22:00 27 ******** 7 2021-11-29 22:10 27 ******** 8 2021-11-29 22:20 27 ******** 9 2021-11-29 22:30 28 ********* 10 2021-11-29 22:40 30 *********** 11 2021-11-29 22:50 32 ************* 12 2021-11-29 23:00 31 ************ 13 2021-11-29 23:10 31 ************ 14 2021-11-29 23:20 30 *********** 15 2021-11-29 23:30 33 ************** 16 2021-11-29 23:40 30 *********** 17 2021-11-29 23:50 31 ************ 18 2021-11-30 00:00 30 *********** 19 2021-11-30 00:10 31 ************ 20 2021-11-30 00:20 30 *********** 21 2021-11-30 00:30 30 *********** 22 2021-11-30 00:40 30 *********** 23 2021-11-30 00:50 31 ************ 24 2021-11-30 01:00 30 *********** 25 2021-11-30 01:10 31 ************ 26 2021-11-30 01:20 31 ************ SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 27 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 27 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC