/dev/ada0 smartctl 7.4 2023-08-01 r5530 [FreeBSD 14.2-RELEASE-p2 amd64] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: Samsung SSD 860 EVO 500GB Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: RVT04B6Q User Capacity: 500,107,862,016 bytes [500 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: In smartctl database 7.3/5528 ATA Version is: ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Fri Feb 28 15:56:03 2025 CST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2], Master PW ID: 0x0001 Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 85) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 094 094 000 - 28508 12 Power_Cycle_Count -O--CK 097 097 000 - 2349 177 Wear_Leveling_Count PO--C- 095 095 000 - 73 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 100 100 010 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O--CK 073 048 000 - 27 195 ECC_Error_Rate -O-RC- 200 200 000 - 0 199 CRC_Error_Count -OSRCK 099 099 000 - 3 235 POR_Recovery_Count -O--C- 099 099 000 - 616 241 Total_LBAs_Written -O--CK 099 099 000 - 76210232344 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x13 GPL R/O 1 SATA NCQ Send and Receive log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 SL VS 16 Device vendor specific log 0xa5 SL VS 16 Device vendor specific log 0xce SL VS 16 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Aborted by host 90% 27874 - # 2 Short offline Completed without error 00% 27874 - # 3 Short offline Aborted by host 80% 27874 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) Device State: Active (0) Current Temperature: 27 Celsius Power Cycle Min/Max Temperature: 26/40 Celsius Lifetime Min/Max Temperature: 16/51 Celsius Specified Max Operating Temperature: 70 Celsius Under/Over Temperature Limit Count: 0/0 SMART Status: 0xc24f (PASSED) SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: 0/70 Celsius Temperature History Size (Index): 128 (118) Index Estimated Time Temperature Celsius 119 2025-02-27 18:40 24 ***** 120 2025-02-27 18:50 23 **** 121 2025-02-27 19:00 24 ***** 122 2025-02-27 19:10 23 **** ... ..( 15 skipped). .. **** 10 2025-02-27 21:50 23 **** 11 2025-02-27 22:00 24 ***** ... ..( 4 skipped). .. ***** 16 2025-02-27 22:50 24 ***** 17 2025-02-27 23:00 25 ****** 18 2025-02-27 23:10 24 ***** ... ..( 5 skipped). .. ***** 24 2025-02-28 00:10 24 ***** 25 2025-02-28 00:20 23 **** ... ..( 9 skipped). .. **** 35 2025-02-28 02:00 23 **** 36 2025-02-28 02:10 22 *** ... ..( 3 skipped). .. *** 40 2025-02-28 02:50 22 *** 41 2025-02-28 03:00 27 ******** 42 2025-02-28 03:10 22 *** ... ..( 13 skipped). .. *** 56 2025-02-28 05:30 22 *** 57 2025-02-28 05:40 21 ** ... ..( 12 skipped). .. ** 70 2025-02-28 07:50 21 ** 71 2025-02-28 08:00 22 *** ... ..( 9 skipped). .. *** 81 2025-02-28 09:40 22 *** 82 2025-02-28 09:50 23 **** 83 2025-02-28 10:00 22 *** 84 2025-02-28 10:10 23 **** 85 2025-02-28 10:20 22 *** ... ..( 3 skipped). .. *** 89 2025-02-28 11:00 22 *** 90 2025-02-28 11:10 23 **** ... ..( 14 skipped). .. **** 105 2025-02-28 13:40 23 **** 106 2025-02-28 13:50 24 ***** 107 2025-02-28 14:00 26 ******* 108 2025-02-28 14:10 26 ******* 109 2025-02-28 14:20 27 ******** 110 2025-02-28 14:30 26 ******* 111 2025-02-28 14:40 ? - 112 2025-02-28 14:50 33 ************** 113 2025-02-28 15:00 27 ******** ... ..( 2 skipped). .. ******** 116 2025-02-28 15:30 27 ******** 117 2025-02-28 15:40 26 ******* 118 2025-02-28 15:50 26 ******* SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 2349 --- Lifetime Power-On Resets 0x01 0x010 4 28508 --- Power-on Hours 0x01 0x018 6 76210232344 --- Logical Sectors Written 0x01 0x020 6 1217704691 --- Number of Write Commands 0x01 0x028 6 128354000665 --- Logical Sectors Read 0x01 0x030 6 1391681156 --- Number of Read Commands 0x01 0x038 6 393000 --- Date and Time TimeStamp 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 618 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 27 --- Current Temperature 0x05 0x020 1 51 --- Highest Temperature 0x05 0x028 1 16 --- Lowest Temperature 0x05 0x058 1 70 --- Specified Maximum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 11079 --- Number of Hardware Resets 0x06 0x010 4 0 --- Number of ASR Events 0x06 0x018 4 3 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 5 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 5 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 5 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC