Probe #a880b1f616 of Samsung 750TDA

Log: smartctl

/dev/da0 smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: WD Blue / Red / Green SSDs Device Model: WDC WDS240G2G0A-00JH30 Serial Number: -- LU WWN Device Id: 5 001b44 ... Firmware Version: UF400400 User Capacity: 240,057,409,536 bytes [240 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic Device is: In smartctl database 7.3/5319 ATA Version is: ACS-3, ACS-2 T13/2015-D revision 3 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Nov 2 14:22:14 2022 EDT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Disabled Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART Status not supported: Incomplete response, ATA output registers missing SMART overall-health self-assessment test result: PASSED Warning: This result is based on an Attribute check. General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x11) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 41) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct -O--CK 100 100 000 - 0 9 Power_On_Hours -O--CK 100 100 000 - 4181 12 Power_Cycle_Count -O--CK 100 100 000 - 2384 165 Block_Erase_Count -O--CK 100 100 000 - 991 166 Minimum_PE_Cycles_TLC -O--CK 100 100 --- - 11 167 Max_Bad_Blocks_per_Die -O--CK 100 100 --- - 23 168 Maximum_PE_Cycles_TLC -O--CK 100 100 --- - 17 169 Total_Bad_Blocks -O--CK 100 100 --- - 164 170 Grown_Bad_Blocks -O--CK 100 100 --- - 0 171 Program_Fail_Count -O--CK 100 100 000 - 0 172 Erase_Fail_Count -O--CK 100 100 000 - 0 173 Average_PE_Cycles_TLC -O--CK 100 100 000 - 11 174 Unexpected_Power_Loss -O--CK 100 100 000 - 626 184 End-to-End_Error -O--CK 100 100 --- - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 0 188 Command_Timeout -O--CK 100 100 --- - 0 194 Temperature_Celsius -O---K 065 048 000 - 35 (Min/Max 16/48) 199 UDMA_CRC_Error_Count -O--CK 100 100 --- - 0 230 Media_Wearout_Indicator -O--CK 100 100 000 - 0x025302140253 232 Available_Reservd_Space PO--CK 100 100 005 - 100 233 NAND_GB_Written_TLC -O--CK 100 100 --- - 2859 234 NAND_GB_Written_SLC -O--CK 100 100 000 - 7899 241 Host_Writes_GiB ----CK 100 100 000 - 3056 242 Host_Reads_GiB ----CK 100 100 000 - 4402 244 Temp_Throttle_Status -O--CK 000 100 --- - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 16 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 GPL,SL VS 1 Device vendor specific log 0xa2 GPL,SL VS 2 Device vendor specific log 0xa3-0xa4 GPL,SL VS 1 Device vendor specific log 0xa7 GPL,SL VS 1 Device vendor specific log 0xa9 GPL,SL VS 4 Device vendor specific log Warning! SMART Extended Comprehensive Error Log Structure error: invalid SMART checksum. SMART Extended Comprehensive Error Log Version: 1 (16 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 4147 - # 2 Short offline Interrupted (host reset) 10% 4054 - # 3 Short offline Self-test routine in progress 20% 4054 - # 4 Short offline Completed without error 00% 4053 - # 5 Short offline Self-test routine in progress 20% 4053 - # 6 Short offline Self-test routine in progress 90% 4053 - # 7 Extended offline Interrupted (host reset) 90% 4021 - # 8 Extended offline Self-test routine in progress 90% 4021 - # 9 Extended offline Self-test routine in progress 90% 4021 - #10 Extended offline Self-test routine in progress 90% 4021 - #11 Extended offline Self-test routine in progress 90% 4021 - #12 Extended offline Self-test routine in progress 90% 4021 - #13 Extended offline Self-test routine in progress 90% 4021 - #14 Extended offline Self-test routine in progress 90% 4021 - #15 Extended offline Self-test routine in progress 90% 4021 - #16 Extended offline Self-test routine in progress 90% 4021 - #17 Extended offline Self-test routine in progress 90% 4021 - #18 Extended offline Self-test routine in progress 90% 4021 - #19 Extended offline Self-test routine in progress 90% 4021 - Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 2384 --- Lifetime Power-On Resets 0x01 0x010 4 4181 --- Power-on Hours 0x01 0x018 6 6409598619 --- Logical Sectors Written 0x01 0x028 6 9232849490 --- Logical Sectors Read 0x01 0x038 6 4181 --- Date and Time TimeStamp 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 35 --- Current Temperature 0x05 0x010 1 - --- Average Short Term Temperature 0x05 0x018 1 - --- Average Long Term Temperature 0x05 0x020 1 47 --- Highest Temperature 0x05 0x028 1 19 --- Lowest Temperature 0x05 0x030 1 - --- Highest Average Short Term Temperature 0x05 0x038 1 - --- Lowest Average Short Term Temperature 0x05 0x040 1 - --- Highest Average Long Term Temperature 0x05 0x048 1 - --- Lowest Average Long Term Temperature 0x05 0x050 4 0 --- Time in Over-Temperature 0x05 0x058 1 95 --- Specified Maximum Operating Temperature 0x05 0x060 4 0 --- Time in Under-Temperature 0x05 0x068 1 0 --- Specified Minimum Operating Temperature 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 2 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0009 2 2 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 3 Device-to-host register FISes sent due to a COMRESET 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0001 2 0 Command failed due to ICRC error /dev/nvd0 smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Number: SAMSUNG MZVLQ256HBJD-00B Serial Number: -- Firmware Version: FXM7AK1Q PCI Vendor/Subsystem ID: 0x144d IEEE OUI Identifier: 0x002538 Total NVM Capacity: 256,060,514,304 [256 GB] Unallocated NVM Capacity: 0 Controller ID: 5 NVMe Version: 1.4 Number of Namespaces: 1 Namespace 1 Size/Capacity: 256,060,514,304 [256 GB] Namespace 1 Utilization: 214,459,465,728 [214 GB] Namespace 1 Formatted LBA Size: 512 Namespace 1 IEEE EUI-64: 002538 ... Local Time is: Wed Nov 2 14:22:14 2022 EDT Firmware Updates (0x16): 3 Slots, no Reset required Optional Admin Commands (0x0017): Security Format Frmw_DL Self_Test Optional NVM Commands (0x0057): Comp Wr_Unc DS_Mngmt Sav/Sel_Feat Timestmp Log Page Attributes (0x0f): S/H_per_NS Cmd_Eff_Lg Ext_Get_Lg Telmtry_Lg Maximum Data Transfer Size: 512 Pages Warning Comp. Temp. Threshold: 83 Celsius Critical Comp. Temp. Threshold: 85 Celsius Namespace 1 Features (0x10): NP_Fields Supported Power States St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat 0 + 5.36W - - 0 0 0 0 0 0 1 + 4.47W - - 1 1 1 1 0 0 2 + 2.23W - - 2 2 2 2 0 500 3 - 0.0500W - - 3 3 3 3 210 1200 4 - 0.0050W - - 4 4 4 4 1000 9000 Supported LBA Sizes (NSID 0x1) Id Fmt Data Metadt Rel_Perf 0 + 512 0 0 === START OF SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED SMART/Health Information (NVMe Log 0x02) Critical Warning: 0x00 Temperature: 28 Celsius Available Spare: 100% Available Spare Threshold: 10% Percentage Used: 5% Data Units Read: 17,159,217 [8.78 TB] Data Units Written: 20,870,998 [10.6 TB] Host Read Commands: 148,614,556 Host Write Commands: 154,723,791 Controller Busy Time: 1,282 Power Cycles: 1,041 Power On Hours: 464 Unsafe Shutdowns: 411 Media and Data Integrity Errors: 0 Error Information Log Entries: 0 Warning Comp. Temperature Time: 0 Critical Comp. Temperature Time: 0 Temperature Sensor 1: 28 Celsius Thermal Temp. 1 Transition Count: 21 Thermal Temp. 1 Total Time: 10 Error Information (NVMe Log 0x01, 16 of 64 entries) No Errors Logged


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