/dev/ada0 smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE amd64] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: SAMSUNG MZNTY256HDHP-000L7 Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: MAT23L6Q User Capacity: 256,060,514,304 bytes [256 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: M.2 TRIM Command: Available Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Fri Jul 26 11:35:40 2024 EDT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 85) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 099 099 000 - 4518 12 Power_Cycle_Count -O--CK 099 099 000 - 672 170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0 171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0 172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0 173 Wear_Leveling_Count PO--CK 095 095 005 - 39 174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 129 178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0 180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 1843 184 End-to-End_Error PO--CK 100 100 097 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 194 Temperature_Celsius -O--CK 068 035 000 - 32 (Min/Max 0/65) 199 CRC_Error_Count -OSRCK 100 100 000 - 0 233 Media_Wearout_Indicator PO--C- 095 095 001 - 15959325 241 Total_LBAs_Written -O--CK 099 099 000 - 5236 242 Total_LBAs_Read -O--CK 099 099 000 - 15034 249 NAND_Writes_1GiB -O--CK 099 099 000 - 9984 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x13 GPL R/O 1 SATA NCQ Send and Receive log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa5 SL VS 16 Device vendor specific log 0xce SL VS 16 Device vendor specific log 0xdf GPL,SL VS 1 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short captive Completed without error 00% 67 - # 2 Extended captive Completed without error 00% 67 - # 3 Extended captive Completed without error 00% 65 - # 4 Extended captive Completed without error 00% 62 - # 5 Short captive Completed without error 00% 60 - # 6 Short offline Completed without error 00% 3 - # 7 Short offline Completed without error 00% 2 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 255 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) Device State: Active (0) Current Temperature: ? Celsius Power Cycle Min/Max Temperature: ?/ ? Celsius Lifetime Min/Max Temperature: 18/54 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: 0/70 Celsius Temperature History Size (Index): 128 (95) Index Estimated Time Temperature Celsius 96 2024-07-25 14:20 20 * ... ..( 20 skipped). .. * 117 2024-07-25 17:50 20 * 118 2024-07-25 18:00 19 - ... ..( 26 skipped). .. - 17 2024-07-25 22:30 19 - 18 2024-07-25 22:40 18 - 19 2024-07-25 22:50 19 - 20 2024-07-25 23:00 ? - 21 2024-07-25 23:10 ? - 22 2024-07-25 23:20 27 ******** 23 2024-07-25 23:30 34 *************** 24 2024-07-25 23:40 26 ******* 25 2024-07-25 23:50 24 ***** 26 2024-07-26 00:00 ? - 27 2024-07-26 00:10 ? - 28 2024-07-26 00:20 17 - 29 2024-07-26 00:30 ? - 30 2024-07-26 00:40 17 - 31 2024-07-26 00:50 22 *** 32 2024-07-26 01:00 32 ************* 33 2024-07-26 01:10 26 ******* 34 2024-07-26 01:20 23 **** 35 2024-07-26 01:30 ? - ... ..( 59 skipped). .. - 95 2024-07-26 11:30 ? - SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 3 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 3 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC