/dev/ada0 smartctl 7.4 2023-08-01 r5530 [FreeBSD 13.2-RELEASE-p5 amd64] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Crucial/Micron Client SSDs Device Model: CT240BX500SSD1 Serial Number: -- LU WWN Device Id: 5 00a075 ... Firmware Version: M6CR041 User Capacity: 240,057,409,536 bytes [240 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available Device is: In smartctl database 7.3/5528 ATA Version is: ACS-3 T13/2161-D revision 4 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Mon Dec 11 05:11:45 2023 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED See vendor-specific Attribute list for marginal Attributes. General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x11) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 10) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 100 100 000 - 0 5 Reallocate_NAND_Blk_Cnt -O--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 100 100 000 - 23828 12 Power_Cycle_Count -O--CK 100 100 000 - 301 171 Program_Fail_Count -O--CK 100 100 000 - 0 172 Erase_Fail_Count -O--CK 100 100 000 - 0 173 Ave_Block-Erase_Count -O--CK 000 000 000 - 1409 174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 135 180 Unused_Reserve_NAND_Blk PO--CK 100 100 000 - 23 183 SATA_Interfac_Downshift -O--CK 100 100 000 - 0 184 Error_Correction_Count -O--CK 100 100 000 - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 0 194 Temperature_Celsius -O---K 074 056 000 - 26 (Min/Max 3/44) 196 Reallocated_Event_Count -O--CK 100 100 000 - 0 197 Current_Pending_ECC_Cnt -O--CK 100 100 000 - 0 198 Offline_Uncorrectable ----CK 100 100 000 - 0 199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0 202 Percent_Lifetime_Remain ----CK 000 000 001 NOW 100 206 Write_Error_Rate -OSR-- 100 100 000 - 0 210 Success_RAIN_Recov_Cnt -O--CK 100 100 000 - 0 246 Total_LBAs_Written -O--CK 100 100 000 - 103920824858 247 Host_Program_Page_Count -O--CK 100 100 000 - 3247525776 248 FTL_Program_Page_Count -O--CK 100 100 000 - 21700196224 249 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 0 250 Read_Error_Retry_Rate -O--CK 100 100 000 - 0 251 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 1479966213 252 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 161 253 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 0 254 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 14200 223 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 5325 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x24 GPL R/O 88 Current Device Internal Status Data log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log not supported SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x0002 4 0 R_ERR response for data FIS 0x0005 4 0 R_ERR response for non-data FIS 0x000a 4 35 Device-to-host register FISes sent due to a COMRESET