/dev/ada0 smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build) Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: EMTEC X150 240GB Serial Number: -- Firmware Version: SBFME1.3 User Capacity: 240,057,409,536 bytes [240 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-4 (minor revision not indicated) SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Feb 10 15:47:20 2021 EST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (65535) seconds. Offline data collection capabilities: (0x79) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 30) minutes. Conveyance self-test routine recommended polling time: ( 6) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate PO-R-- 100 100 050 - 0 9 Power_On_Hours -O--C- 100 100 000 - 3886 12 Power_Cycle_Count -O--C- 100 100 000 - 542 168 Unknown_Attribute -O--C- 100 100 000 - 0 170 Unknown_Attribute PO---- 100 100 010 - 12 173 Unknown_Attribute -O--C- 100 100 000 - 1376293 192 Power-Off_Retract_Count -O--C- 100 100 000 - 42 194 Temperature_Celsius PO---K 067 067 000 - 33 (Min/Max 33/33) 218 Unknown_Attribute PO-R-- 100 100 050 - 0 231 Temperature_Celsius PO--C- 100 100 000 - 97 241 Total_LBAs_Written -O--C- 100 100 000 - 2335 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 51 Comprehensive SMART error log 0x03 GPL R/O 64 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log Version: 1 (64 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 542 --- Lifetime Power-On Resets 0x01 0x010 4 3886 --- Power-on Hours 0x01 0x018 6 4897836831 --- Logical Sectors Written 0x01 0x028 6 3116881003 --- Logical Sectors Read 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 33 --- Current Temperature 0x05 0x020 1 33 --- Highest Temperature 0x05 0x028 1 33 --- Lowest Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 2 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 4 8 Transition from drive PhyRdy to drive PhyNRdy 0x000a 4 9 Device-to-host register FISes sent due to a COMRESET 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC /dev/ada1 smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build) Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Western Digital Blue Device Model: WDC WD5000AAKX-00ERMA0 Serial Number: -- LU WWN Device Id: 5 0014ee ... Firmware Version: 15.01H15 User Capacity: 500,107,862,016 bytes [500 GB] Sector Size: 512 bytes logical/physical Rotation Rate: 7200 rpm Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS (minor revision not indicated) SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Wed Feb 10 15:47:20 2021 EST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 8580) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 87) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x3037) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 200 200 051 - 0 3 Spin_Up_Time POS--K 139 137 021 - 4033 4 Start_Stop_Count -O--CK 099 099 000 - 1972 5 Reallocated_Sector_Ct PO--CK 200 200 140 - 0 7 Seek_Error_Rate -OSR-K 200 200 000 - 0 9 Power_On_Hours -O--CK 087 087 000 - 9886 10 Spin_Retry_Count -O--CK 100 100 000 - 0 11 Calibration_Retry_Count -O--CK 100 100 000 - 0 12 Power_Cycle_Count -O--CK 099 099 000 - 1971 192 Power-Off_Retract_Count -O--CK 200 200 000 - 100 193 Load_Cycle_Count -O--CK 200 200 000 - 1871 194 Temperature_Celsius -O---K 108 097 000 - 35 196 Reallocated_Event_Count -O--CK 200 200 000 - 0 197 Current_Pending_Sector -O--CK 200 200 000 - 0 198 Offline_Uncorrectable ----CK 200 200 000 - 0 199 UDMA_CRC_Error_Count -O--CK 200 200 000 - 0 200 Multi_Zone_Error_Rate ---R-- 200 200 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 5 Comprehensive SMART error log 0x03 GPL R/O 6 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa0-0xa7 GPL,SL VS 16 Device vendor specific log 0xa8-0xb5 GPL,SL VS 1 Device vendor specific log 0xb6 GPL VS 1 Device vendor specific log 0xb7 GPL,SL VS 1 Device vendor specific log 0xbd GPL,SL VS 1 Device vendor specific log 0xc0 GPL,SL VS 1 Device vendor specific log 0xc1 GPL VS 24 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (6 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 4 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 258 (0x0102) Device State: Active (0) Current Temperature: 35 Celsius Power Cycle Min/Max Temperature: 20/35 Celsius Lifetime Min/Max Temperature: 0/46 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 0/60 Celsius Min/Max Temperature Limit: -41/85 Celsius Temperature History Size (Index): 478 (33) Index Estimated Time Temperature Celsius 34 2021-02-10 07:50 35 **************** ... ..(476 skipped). .. **************** 33 2021-02-10 15:47 35 **************** SCT Error Recovery Control command not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x000a 2 6 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x8000 4 52402 Vendor specific /dev/ada2 smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build) Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Western Digital Green Device Model: WDC WD20EARX-00PASB0 Serial Number: -- LU WWN Device Id: 5 0014ee ... Firmware Version: 51.0AB51 User Capacity: 2,000,398,934,016 bytes [2.00 TB] Sector Sizes: 512 bytes logical, 4096 bytes physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS (minor revision not indicated) SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s) Local Time is: Wed Feb 10 15:47:21 2021 EST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (37260) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 360) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x3035) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 200 200 051 - 0 3 Spin_Up_Time POS--K 163 162 021 - 6808 4 Start_Stop_Count -O--CK 093 093 000 - 7707 5 Reallocated_Sector_Ct PO--CK 200 200 140 - 0 7 Seek_Error_Rate -OSR-K 200 200 000 - 0 9 Power_On_Hours -O--CK 089 089 000 - 8262 10 Spin_Retry_Count -O--CK 100 100 000 - 0 11 Calibration_Retry_Count -O--CK 100 100 000 - 0 12 Power_Cycle_Count -O--CK 097 097 000 - 3741 192 Power-Off_Retract_Count -O--CK 200 200 000 - 411 193 Load_Cycle_Count -O--CK 175 175 000 - 76232 194 Temperature_Celsius -O---K 120 099 000 - 30 196 Reallocated_Event_Count -O--CK 200 200 000 - 0 197 Current_Pending_Sector -O--CK 200 200 000 - 0 198 Offline_Uncorrectable ----CK 200 200 000 - 0 199 UDMA_CRC_Error_Count -O--CK 200 200 000 - 0 200 Multi_Zone_Error_Rate ---R-- 200 200 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 5 Comprehensive SMART error log 0x03 GPL R/O 6 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa0-0xa7 GPL,SL VS 16 Device vendor specific log 0xa8-0xb7 GPL,SL VS 1 Device vendor specific log 0xbd GPL,SL VS 1 Device vendor specific log 0xc0 GPL,SL VS 1 Device vendor specific log 0xc1 GPL VS 93 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (6 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 258 (0x0102) Device State: Active (0) Current Temperature: 30 Celsius Power Cycle Min/Max Temperature: 19/32 Celsius Lifetime Min/Max Temperature: 0/51 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 0/60 Celsius Min/Max Temperature Limit: -41/85 Celsius Temperature History Size (Index): 478 (148) Index Estimated Time Temperature Celsius 149 2021-02-10 07:50 30 *********** ... ..(323 skipped). .. *********** 473 2021-02-10 13:14 30 *********** 474 2021-02-10 13:15 32 ************* 475 2021-02-10 13:16 30 *********** ... ..(150 skipped). .. *********** 148 2021-02-10 15:47 30 *********** SCT Error Recovery Control command not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x000a 2 6 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x8000 4 52400 Vendor specific /dev/da0 smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build) Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Western Digital Green Device Model: WDC WD20EZRX-00D8PB0 Serial Number: -- LU WWN Device Id: 5 0014ee ... Firmware Version: 80.00A80 User Capacity: 2,000,398,934,016 bytes [2.00 TB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: 5400 rpm Device is: In smartctl database [for details use: -P show] ATA Version is: ACS-2 (minor revision not indicated) SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s) Local Time is: Wed Feb 10 15:47:21 2021 EST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (27360) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 276) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x7035) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 200 200 051 - 0 3 Spin_Up_Time POS--K 179 177 021 - 6008 4 Start_Stop_Count -O--CK 097 097 000 - 3751 5 Reallocated_Sector_Ct PO--CK 200 200 140 - 0 7 Seek_Error_Rate -OSR-K 200 200 000 - 0 9 Power_On_Hours -O--CK 095 095 000 - 4125 10 Spin_Retry_Count -O--CK 100 100 000 - 0 11 Calibration_Retry_Count -O--CK 100 100 000 - 0 12 Power_Cycle_Count -O--CK 097 097 000 - 3725 192 Power-Off_Retract_Count -O--CK 200 200 000 - 171 193 Load_Cycle_Count -O--CK 193 193 000 - 22245 194 Temperature_Celsius -O---K 115 097 000 - 35 196 Reallocated_Event_Count -O--CK 200 200 000 - 0 197 Current_Pending_Sector -O--CK 200 200 000 - 0 198 Offline_Uncorrectable ----CK 200 200 000 - 0 199 UDMA_CRC_Error_Count -O--CK 200 200 000 - 0 200 Multi_Zone_Error_Rate ---R-- 200 200 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 5 Comprehensive SMART error log 0x03 GPL R/O 6 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa0-0xa7 GPL,SL VS 16 Device vendor specific log 0xa8-0xb7 GPL,SL VS 1 Device vendor specific log 0xbd GPL,SL VS 1 Device vendor specific log 0xc0 GPL,SL VS 1 Device vendor specific log 0xc1 GPL VS 93 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (6 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 258 (0x0102) Device State: Active (0) Current Temperature: 35 Celsius Power Cycle Min/Max Temperature: 19/35 Celsius Lifetime Min/Max Temperature: 15/53 Celsius Under/Over Temperature Limit Count: 0/0 Vendor specific: 01 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 0/60 Celsius Min/Max Temperature Limit: -41/85 Celsius Temperature History Size (Index): 478 (375) Index Estimated Time Temperature Celsius 376 2021-02-10 07:50 34 *************** ... ..(123 skipped). .. *************** 22 2021-02-10 09:54 34 *************** 23 2021-02-10 09:55 35 **************** ... ..( 23 skipped). .. **************** 47 2021-02-10 10:19 35 **************** 48 2021-02-10 10:20 34 *************** ... ..(326 skipped). .. *************** 375 2021-02-10 15:47 34 *************** SCT Error Recovery Control command not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 0 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 1 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x8000 4 52401 Vendor specific /dev/da3 smartctl 7.1 2019-12-30 r5022 [FreeBSD 12.1-RELEASE amd64] (local build) Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: SAMSUNG SpinPoint F3 Device Model: SAMSUNG HD502HJ Serial Number: -- LU WWN Device Id: 5 0024e9 ... Firmware Version: 1AJ10001 User Capacity: 500,107,862,016 bytes [500 GB] Sector Size: 512 bytes logical/physical Rotation Rate: 7200 rpm Form Factor: 3.5 inches Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS T13/1699-D revision 6 SATA Version is: SATA 2.6, 3.0 Gb/s Local Time is: Wed Feb 10 15:47:21 2021 EST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Disabled APM feature is: Disabled Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Write SCT (Get) Feature Control Command failed: Read of ATA output registers not implemented [JMicron] Wt Cache Reorder: Unknown (SCT Feature Control command failed) === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 4560) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 76) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 100 100 051 - 6 2 Throughput_Performance -OS--K 252 252 000 - 0 3 Spin_Up_Time PO---K 082 082 025 - 5564 4 Start_Stop_Count -O--CK 100 100 000 - 144 5 Reallocated_Sector_Ct PO--CK 252 252 010 - 0 7 Seek_Error_Rate -OSR-K 252 252 051 - 0 8 Seek_Time_Performance --S--K 252 252 015 - 0 9 Power_On_Hours -O--CK 100 100 000 - 45051 10 Spin_Retry_Count -O--CK 252 252 051 - 0 11 Calibration_Retry_Count -O--CK 252 252 000 - 0 12 Power_Cycle_Count -O--CK 100 100 000 - 150 191 G-Sense_Error_Rate -O---K 252 252 000 - 0 192 Power-Off_Retract_Count -O---K 252 252 000 - 0 194 Temperature_Celsius -O---- 064 048 000 - 35 (Min/Max 17/53) 195 Hardware_ECC_Recovered -O-RCK 100 100 000 - 0 196 Reallocated_Event_Count -O--CK 252 252 000 - 0 197 Current_Pending_Sector -O--CK 252 252 000 - 0 198 Offline_Uncorrectable ----CK 252 252 000 - 0 199 UDMA_CRC_Error_Count -OS-CK 100 100 000 - 18 200 Multi_Zone_Error_Rate -O-R-K 100 100 000 - 7 223 Load_Retry_Count -O--CK 252 252 000 - 0 225 Load_Cycle_Count -O--CK 100 100 000 - 151 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning ATA_READ_LOG_EXT (addr=0x00:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented [JMicron] Read GP Log Directory failed SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 2 Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x09 SL R/W 1 Selective self-test log 0x80-0x9f SL R/W 16 Host vendor specific log 0xe0 SL R/W 1 SCT Command/Status 0xe1 SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 ATA Error Count: 1 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1 occurred at disk power-on lifetime: 18658 hours (777 days + 10 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 01 00 00 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000000 = 0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 01 00 00 00 e0 00 00:08:16.000 READ DMA ef 03 42 00 00 00 a0 00 00:08:16.000 SET FEATURES [Set transfer mode] ec 00 00 00 00 00 a0 00 00:08:16.000 IDENTIFY DEVICE 00 00 01 01 00 00 00 00 00:08:16.000 NOP [Abort queued commands] 00 00 01 01 00 00 00 00 00:08:15.996 NOP [Abort queued commands] SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Completed [00% left] (0-65535) 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 2 SCT Version (vendor specific): 256 (0x0100) Device State: Active (0) Current Temperature: 35 Celsius Power Cycle Min/Max Temperature: 21/35 Celsius Lifetime Min/Max Temperature: 20/67 Celsius Specified Max Operating Temperature: 80 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 5 minutes Temperature Logging Interval: 5 minutes Min/Max recommended Temperature: -5/80 Celsius Min/Max Temperature Limit: -10/85 Celsius Temperature History Size (Index): 128 (0) Index Estimated Time Temperature Celsius 1 2021-02-10 05:10 34 *************** ... ..( 20 skipped). .. *************** 22 2021-02-10 06:55 34 *************** 23 2021-02-10 07:00 35 **************** ... ..(104 skipped). .. **************** 0 2021-02-10 15:45 35 **************** Write SCT (Get) Error Recovery Control Command failed: Read of ATA output registers not implemented [JMicron] SCT (Get) Error Recovery Control command failed Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported ATA_READ_LOG_EXT (addr=0x11:0x00, page=0, n=1) failed: 48-bit ATA commands not implemented [JMicron] Read SATA Phy Event Counters failed