/dev/ada0 smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.0-STABLE amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: SanDisk SD8TB8U-128G-1006 Serial Number: -- LU WWN Device Id: 5 001b44 ... Firmware Version: X4143106 User Capacity: 128,035,676,160 bytes [128 GB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: Not in smartctl database 7.3/5319 ATA Version is: ACS-2 T13/2015-D revision 3 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sat Jan 14 08:31:52 2023 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 128 (minimum power consumption without standby) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Disabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 10) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 32 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 100 100 050 - 2 5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0 9 Power_On_Hours -O--CK 100 100 --- - 4932 12 Power_Cycle_Count -O--CK 100 100 --- - 148 171 Unknown_Attribute -O--CK 100 100 --- - 0 172 Unknown_Attribute -O--CK 100 100 --- - 0 173 Unknown_Attribute -O--CK 100 100 005 - 1 174 Unknown_Attribute -O--CK 100 100 --- - 125 176 Erase_Fail_Count_Chip -O---K 100 100 --- - 1088 181 Program_Fail_Cnt_Total -O---K 093 084 --- - 2738233 183 Runtime_Bad_Block -O--CK 100 100 --- - 0 184 End-to-End_Error PO-RCK 100 100 097 - 0 187 Reported_Uncorrect -O--CK 100 100 --- - 0 188 Command_Timeout -O--CK 100 100 --- - 1 194 Temperature_Celsius -O---K 037 062 --- - 37 (Min/Max 9/62) 198 Offline_Uncorrectable ----CK 100 100 --- - 0 199 UDMA_CRC_Error_Count -O--CK 100 100 --- - 0 201 Unknown_SSD_Attribute PO---K 100 100 005 - 1 230 Unknown_SSD_Attribute -O--CK 100 100 --- - 1486081359886 241 Total_LBAs_Written -O--CK 100 100 --- - 118716 242 Total_LBAs_Read -O--CK 100 100 --- - 15716 243 Unknown_Attribute -O--CK 100 100 --- - 184543 244 Unknown_Attribute -O--CK 000 100 --- - 0 249 Unknown_Attribute -O--CK 100 100 --- - 195 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 2 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x0a GPL R/W 255 Device Statistics Notification 0x0c GPL R/O 32 Pending Defects log 0x0d GPL,SL R/O 16 LPS Mis-alignment log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x19 GPL R/O 63 LBA Status log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xde GPL VS 8 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 257 (0x0101) Device State: Active (0) Current Temperature: 37 Celsius Power Cycle Min/Max Temperature: 31/41 Celsius Lifetime Min/Max Temperature: 31/41 Celsius Specified Max Operating Temperature: 37 Celsius Under/Over Temperature Limit Count: 0/0 Vendor specific: 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 01 00 01 00 01 00 00 00 00 00 00 00 00 00 00 00 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: -15/90 Celsius Temperature History Size (Index): 256 (96) Index Estimated Time Temperature Celsius 97 2023-01-14 04:16 37 ****************** ... ..(254 skipped). .. ****************** 96 2023-01-14 08:31 37 ****************** SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 148 -D- Lifetime Power-On Resets 0x01 0x010 4 4932 -D- Power-on Hours 0x01 0x018 6 0 -D- Logical Sectors Written 0x01 0x020 6 118716 -D- Number of Write Commands 0x01 0x028 6 15716 -D- Logical Sectors Read 0x01 0x030 6 184543 -D- Number of Read Commands 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 -D- Number of Reported Uncorrectable Errors 0x04 0x010 4 0 -D- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 22 -D- Current Temperature 0x05 0x020 1 64 -D- Highest Temperature 0x05 0x028 1 22 -D- Lowest Temperature 0x05 0x038 1 0 -D- Lowest Average Short Term Temperature 0x05 0x058 1 70 -D- Specified Maximum Operating Temperature 0x05 0x068 1 0 -D- Specified Minimum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 205 -D- Number of Hardware Resets 0x06 0x010 4 66 -D- Number of ASR Events 0x06 0x018 4 0 -D- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 0 ND- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) No Defects Logged SATA Phy Event Counters (GP Log 0x11) ID Size Value Description