/dev/ada0 smartctl 7.4 2023-08-01 r5530 [FreeBSD 13.2-RELEASE-p3 amd64] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: TOSHIBA THNSNK256GVN8 M.2 2280 256GB Serial Number: -- LU WWN Device Id: 5 00080d ... Firmware Version: K8DC4101 User Capacity: 256,060,514,304 bytes [256 GB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: Solid State Device Form Factor: M.2 TRIM Command: Available, deterministic, zeroed Device is: Not in smartctl database 7.3/5528 ATA Version is: ACS-3 (minor revision not indicated) SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue Oct 3 18:34:49 2023 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 254 (maximum performance) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 11) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 100 9 Power_On_Hours -O--C- 100 100 000 - 24510 12 Power_Cycle_Count PO--CK 100 100 000 - 681 166 Unknown_Attribute -O--C- 100 100 000 - 0 167 Unknown_Attribute -O---K 100 100 000 - 0 168 Unknown_Attribute -O--C- 100 100 000 - 0 173 Unknown_Attribute -O--C- 183 183 000 - 0 175 Program_Fail_Count_Chip PO--CK 100 100 010 - 0 176 Erase_Fail_Count_Chip PO--CK 100 100 010 - 0 177 Wear_Leveling_Count PO--CK 083 083 010 - 0 178 Used_Rsvd_Blk_Cnt_Chip PO--CK 100 100 010 - 0 179 Used_Rsvd_Blk_Cnt_Tot PO--CK 100 100 010 - 100 180 Unused_Rsvd_Blk_Cnt_Tot PO--CK 100 100 010 - 100 181 Program_Fail_Cnt_Total PO--CK 100 100 010 - 100 182 Erase_Fail_Count_Total PO--CK 100 100 010 - 100 187 Reported_Uncorrect PO--CK 100 100 000 - 0 192 Power-Off_Retract_Count -O--C- 100 100 000 - 57 194 Temperature_Celsius -O---K 049 029 000 - 51 (Min/Max 7/71) 195 Hardware_ECC_Recovered PO-R-K 100 100 000 - 0 199 UDMA_CRC_Error_Count -O--C- 100 100 000 - 0 238 Unknown_Attribute -O--CK 083 083 010 - 0 241 Total_LBAs_Written PO--C- 100 100 000 - 578712 242 Total_LBAs_Read PO--C- 100 100 000 - 38716 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 51 Comprehensive SMART error log 0x03 GPL R/O 64 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x24 GPL R/O 4915 Current Device Internal Status Data log 0x25 GPL R/O 24577 Saved Device Internal Status Data log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (64 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 9397 - # 2 Short offline Aborted by host 00% 370 - # 3 Short offline Aborted by host 00% 370 - # 4 Short offline Completed without error 00% 0 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 3 (0x0003) Device State: Active (0) Current Temperature: 51 Celsius Power Cycle Min/Max Temperature: 51/53 Celsius Lifetime Min/Max Temperature: 7/71 Celsius Under/Over Temperature Limit Count: 0/2 Vendor specific: 00 00 04 00 01 01 00 05 05 00 00 00 00 12 54 80 00 02 00 00 f4 5f 42 05 10 00 00 00 00 00 00 08 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 5/40 Celsius Min/Max Temperature Limit: 0/80 Celsius Temperature History Size (Index): 128 (81) Index Estimated Time Temperature Celsius 82 2023-10-03 16:27 52 ********************************* ... ..( 91 skipped). .. ********************************* 46 2023-10-03 17:59 52 ********************************* 47 2023-10-03 18:00 51 ******************************** ... ..( 3 skipped). .. ******************************** 51 2023-10-03 18:04 51 ******************************** 52 2023-10-03 18:05 52 ********************************* ... ..( 25 skipped). .. ********************************* 78 2023-10-03 18:31 52 ********************************* 79 2023-10-03 18:32 ? - 80 2023-10-03 18:33 53 ********************************** 81 2023-10-03 18:34 51 ******************************** SCT Error Recovery Control: Read: 600 (60.0 seconds) Write: 600 (60.0 seconds) Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 2) == 0x01 0x008 4 681 --- Lifetime Power-On Resets 0x01 0x018 6 37926471180 --- Logical Sectors Written 0x01 0x020 6 427760026 --- Number of Write Commands 0x01 0x028 6 2537331906 --- Logical Sectors Read 0x01 0x030 6 41722369 --- Number of Read Commands 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 8 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 51 --- Current Temperature 0x05 0x010 1 - --- Average Short Term Temperature 0x05 0x018 1 - --- Average Long Term Temperature 0x05 0x020 1 60 --- Highest Temperature 0x05 0x028 1 25 --- Lowest Temperature 0x05 0x030 1 56 --- Highest Average Short Term Temperature 0x05 0x038 1 44 --- Lowest Average Short Term Temperature 0x05 0x040 1 51 --- Highest Average Long Term Temperature 0x05 0x048 1 48 --- Lowest Average Long Term Temperature 0x05 0x050 4 1443690 --- Time in Over-Temperature 0x05 0x058 1 40 --- Specified Maximum Operating Temperature 0x05 0x060 4 0 --- Time in Under-Temperature 0x05 0x068 1 5 --- Specified Minimum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 2274 --- Number of Hardware Resets 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 22 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 4 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 4 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 4 2 Transition from drive PhyRdy to drive PhyNRdy 0x000a 4 3 Device-to-host register FISes sent due to a COMRESET 0x000b 4 0 CRC errors within host-to-device FIS 0x000d 4 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC