Probe #6e96ea55ee of ASUSTek X71Vn

Log: smartctl

/dev/ada0 smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: SanDisk based SSDs Device Model: SanDisk SDSSDP128G Serial Number: -- LU WWN Device Id: 5 001b44 ... Firmware Version: 3.2.0 User Capacity: 126,035,288,064 bytes [126 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 1.8 inches TRIM Command: Available, deterministic Device is: In smartctl database 7.3/5319 ATA Version is: ACS-2 T13/2015-D revision 3 SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s) Local Time is: Wed Mar 22 16:48:47 2023 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Disabled Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x51) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 21) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct -O---- 100 100 000 - 0 9 Power_On_Hours -O---- 100 100 000 - 972 12 Power_Cycle_Count -O---- 100 100 000 - 1867 165 Total_Write/Erase_Count -O---- 100 100 000 - 228295 171 Program_Fail_Count -O---- 100 100 000 - 0 172 Erase_Fail_Count -O---- 100 100 000 - 0 173 Avg_Write/Erase_Count -O---- 100 100 000 - 58 174 Unexpect_Power_Loss_Ct -O---- 100 100 000 - 144 187 Reported_Uncorrect -O---- 100 100 000 - 0 194 Temperature_Celsius -O---K 062 038 000 - 38 (Min/Max 15/46) 230 Perc_Write/Erase_Count -O---- 100 100 000 - 193 232 Perc_Avail_Resrvd_Space PO---- 100 100 005 - 0 234 Perc_Write/Erase_Ct_BC -O---- 100 100 000 - 326 241 Total_LBAs_Written -O---- 100 100 000 - 6959290470 242 Total_LBAs_Read -O---- 100 100 000 - 20341148830 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 GPL,SL R/O 1 Summary SMART error log 0x03 GPL,SL R/O 16 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 GPL,SL R/O 1 SMART self-test log 0x09 GPL,SL R/W 1 Selective self-test log 0x10 GPL,SL R/O 1 NCQ Command Error log 0x11 GPL,SL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 GPL,SL VS 1 Device vendor specific log 0xa2 GPL,SL VS 2 Device vendor specific log 0xa3 GPL,SL VS 1 Device vendor specific log 0xa6-0xa7 GPL,SL VS 255 Device vendor specific log Warning! SMART Extended Comprehensive Error Log Structure error: invalid SMART checksum. SMART Extended Comprehensive Error Log Version: 1 (16 sectors) No Errors Logged SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 38 --- Current Temperature 0x05 0x010 1 - --- Average Short Term Temperature 0x05 0x018 1 - --- Average Long Term Temperature 0x05 0x020 1 45 --- Highest Temperature 0x05 0x028 1 19 --- Lowest Temperature 0x05 0x030 1 - --- Highest Average Short Term Temperature 0x05 0x038 1 - --- Lowest Average Short Term Temperature 0x05 0x040 1 - --- Highest Average Long Term Temperature 0x05 0x048 1 - --- Lowest Average Long Term Temperature 0x05 0x050 4 0 --- Time in Over-Temperature 0x05 0x058 1 95 --- Specified Maximum Operating Temperature 0x05 0x060 4 0 --- Time in Under-Temperature 0x05 0x068 1 0 --- Specified Minimum Operating Temperature 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 1 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0009 2 9 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 10 Device-to-host register FISes sent due to a COMRESET 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0001 2 0 Command failed due to ICRC error /dev/ada1 smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Seagate Momentus 5400.5 Device Model: ST9320320AS Serial Number: -- LU WWN Device Id: 5 000c50 ... Firmware Version: 0303 User Capacity: 320,072,933,376 bytes [320 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database 7.3/5319 ATA Version is: ATA8-ACS T13/1699-D revision 4 SATA Version is: SATA 2.6, 3.0 Gb/s Local Time is: Wed Mar 22 16:48:47 2023 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 128 (minimum power consumption without standby) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unknown === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 723) seconds. Offline data collection capabilities: (0x73) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 118) minutes. Conveyance self-test routine recommended polling time: ( 2) minutes. SCT capabilities: (0x103f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 111 099 006 - 34881319 3 Spin_Up_Time PO---- 099 095 000 - 0 4 Start_Stop_Count -O--CK 094 094 020 - 6665 5 Reallocated_Sector_Ct PO--CK 100 100 036 - 0 7 Seek_Error_Rate POSR-- 081 060 030 - 145682991 9 Power_On_Hours -O--CK 090 090 000 - 8806 10 Spin_Retry_Count PO--C- 100 100 097 - 0 12 Power_Cycle_Count -O--CK 096 096 020 - 4514 184 End-to-End_Error -O--CK 100 100 099 - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 0 188 Command_Timeout -O--CK 100 090 000 - 42950328334 189 High_Fly_Writes -O-RCK 100 100 000 - 0 190 Airflow_Temperature_Cel -O---K 064 056 045 - 36 (Min/Max 36/36) 191 G-Sense_Error_Rate -O--CK 100 100 000 - 68 192 Power-Off_Retract_Count -O--CK 099 099 000 - 3948 193 Load_Cycle_Count -O--CK 087 087 000 - 26440 194 Temperature_Celsius -O---K 036 044 000 - 36 (0 11 0 0 0) 195 Hardware_ECC_Recovered -O-RC- 054 047 000 - 34881319 197 Current_Pending_Sector -O--C- 100 100 000 - 0 198 Offline_Uncorrectable ----C- 100 100 000 - 0 199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 GPL,SL R/O 1 Summary SMART error log 0x02 GPL,SL R/O 5 Comprehensive SMART error log 0x03 GPL,SL R/O 5 Ext. Comprehensive SMART error log 0x06 GPL,SL R/O 1 SMART self-test log 0x07 GPL,SL R/O 1 Extended self-test log 0x09 GPL,SL R/W 1 Selective self-test log 0x10 GPL,SL R/O 1 NCQ Command Error log 0x11 GPL,SL R/O 1 SATA Phy Event Counters log 0x21 GPL,SL R/O 1 Write stream error log 0x22 GPL,SL R/O 1 Read stream error log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa1 GPL,SL VS 20 Device vendor specific log 0xa2 GPL VS 2248 Device vendor specific log 0xa8 GPL,SL VS 20 Device vendor specific log 0xa9 GPL,SL VS 1 Device vendor specific log 0xb0 GPL VS 2819 Device vendor specific log 0xbe-0xbf GPL VS 65535 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (5 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 522 (0x020a) Device State: Active (0) Current Temperature: 36 Celsius Power Cycle Min/Max Temperature: 36/36 Celsius Lifetime Min/Max Temperature: 11/44 Celsius Under/Over Temperature Limit Count: 0/3 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 0/ 0 Celsius Min/Max Temperature Limit: 0/ 0 Celsius Temperature History Size (Index): 128 (120) Index Estimated Time Temperature Celsius 121 2023-03-22 14:41 34 *************** ... ..(101 skipped). .. *************** 95 2023-03-22 16:23 34 *************** 96 2023-03-22 16:24 ? - 97 2023-03-22 16:25 34 *************** ... ..( 3 skipped). .. *************** 101 2023-03-22 16:29 34 *************** 102 2023-03-22 16:30 35 **************** 103 2023-03-22 16:31 ? - 104 2023-03-22 16:32 24 ***** 105 2023-03-22 16:33 ? - 106 2023-03-22 16:34 22 *** 107 2023-03-22 16:35 23 **** 108 2023-03-22 16:36 24 ***** 109 2023-03-22 16:37 25 ****** 110 2023-03-22 16:38 27 ******** 111 2023-03-22 16:39 29 ********** 112 2023-03-22 16:40 31 ************ 113 2023-03-22 16:41 32 ************* 114 2023-03-22 16:42 34 *************** 115 2023-03-22 16:43 35 **************** 116 2023-03-22 16:44 35 **************** 117 2023-03-22 16:45 ? - 118 2023-03-22 16:46 36 ***************** 119 2023-03-22 16:47 36 ***************** 120 2023-03-22 16:48 36 ***************** SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x000a 2 9 Device-to-host register FISes sent due to a COMRESET 0x0001 2 0 Command failed due to ICRC error 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS


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