/dev/sd0 smartctl 7.3 2022-02-28 r5338 [OpenBSD 7.1 amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: SAMSUNG MZNLN512HMJP-000L7 Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: MAV21L6Q User Capacity: 512,110,190,592 bytes [512 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: M.2 TRIM Command: Available Device is: In smartctl database 7.3/5319 ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Mon Jun 6 00:05:26 2022 +05 SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART Status not supported: Incomplete response, ATA output registers missing SMART overall-health self-assessment test result: PASSED Warning: This result is based on an Attribute check. General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 85) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0 9 Power_On_Hours 0x0032 098 098 000 Old_age Always - 5303 12 Power_Cycle_Count 0x0032 096 096 000 Old_age Always - 3836 170 Unused_Rsvd_Blk_Ct_Chip 0x0032 100 100 010 Old_age Always - 0 171 Program_Fail_Count_Chip 0x0032 100 100 010 Old_age Always - 0 172 Erase_Fail_Count_Chip 0x0032 100 100 010 Old_age Always - 0 173 Wear_Leveling_Count 0x0033 096 096 005 Pre-fail Always - 46 174 Unexpect_Power_Loss_Ct 0x0032 099 099 000 Old_age Always - 125 178 Used_Rsvd_Blk_Cnt_Chip 0x0013 100 100 010 Pre-fail Always - 0 180 Unused_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 1568 184 End-to-End_Error 0x0033 100 100 097 Pre-fail Always - 0 187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0 194 Temperature_Celsius 0x0032 062 037 000 Old_age Always - 38 (Min/Max 4/63) 199 CRC_Error_Count 0x003e 099 099 000 Old_age Always - 1 233 Media_Wearout_Indicator 0x0013 096 096 001 Pre-fail Always - 16134088 241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 20213 242 Total_LBAs_Read 0x0032 099 099 000 Old_age Always - 30358 249 NAND_Writes_1GiB 0x0032 099 099 000 Old_age Always - 23552 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 255 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.