/dev/ada0 smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE-p5 amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Western Digital Caviar SE Serial ATA Device Model: WDC WD1600JS-00NCB1 Serial Number: -- Firmware Version: 10.02E02 User Capacity: 160,041,885,696 bytes [160 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database 7.3/5319 ATA Version is: ATA/ATAPI-7 (minor revision not indicated) Local Time is: Fri Jul 28 20:24:20 2023 SAST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Disabled APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED See vendor-specific Attribute list for marginal Attributes. General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 5400) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 64) minutes. Conveyance self-test routine recommended polling time: ( 6) minutes. SCT capabilities: (0x103f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 200 200 051 - 0 3 Spin_Up_Time PO---- 192 177 021 - 3358 4 Start_Stop_Count -O--CK 099 099 000 - 1998 5 Reallocated_Sector_Ct PO--CK 200 200 140 - 0 7 Seek_Error_Rate POSR-- 200 200 051 - 0 9 Power_On_Hours -O--CK 068 068 000 - 24070 10 Spin_Retry_Count PO--C- 100 100 051 - 0 11 Calibration_Retry_Count -O--C- 100 100 051 - 0 12 Power_Cycle_Count -O--CK 099 099 000 - 1396 190 Airflow_Temperature_Cel -O---K 052 031 045 Past 48 194 Temperature_Celsius -O---K 099 078 000 - 48 196 Reallocated_Event_Count -O--CK 200 200 000 - 0 197 Current_Pending_Sector -O--C- 200 200 000 - 0 198 Offline_Uncorrectable ----C- 200 200 000 - 0 199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 0 200 Multi_Zone_Error_Rate P--R-- 200 200 051 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 5 Comprehensive SMART error log 0x03 GPL R/O 6 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa0-0xa7 GPL,SL VS 16 Device vendor specific log 0xa8-0xb7 GPL,SL VS 1 Device vendor specific log 0xc0 GPL,SL VS 1 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (6 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 2 SCT Version (vendor specific): 258 (0x0102) Device State: Active (0) Current Temperature: 48 Celsius Power Cycle Min/Max Temperature: --/50 Celsius Lifetime Min/Max Temperature: --/69 Celsius SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 5/65 Celsius Min/Max Temperature Limit: 1/70 Celsius Temperature History Size (Index): 128 (36) Index Estimated Time Temperature Celsius 37 2023-07-28 18:17 48 ***************************** ... ..(126 skipped). .. ***************************** 36 2023-07-28 20:24 48 ***************************** SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x000a 2 5 Device-to-host register FISes sent due to a COMRESET 0x8000 4 25746 Vendor specific /dev/ada1 smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE-p5 amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Seagate Barracuda 7200.7 and 7200.7 Plus Device Model: ST3160827AS Serial Number: -- Firmware Version: 3.42 User Capacity: 160,041,885,696 bytes [160 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database 7.3/5319 ATA Version is: ATA/ATAPI-6 T13/1410D revision 2 Local Time is: Fri Jul 28 20:24:21 2023 SAST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 430) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 94) minutes. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-- 054 047 006 - 61488271 3 Spin_Up_Time PO---- 097 096 000 - 0 4 Start_Stop_Count -O--CK 098 098 020 - 2842 5 Reallocated_Sector_Ct PO--CK 099 099 036 - 58 7 Seek_Error_Rate POSR-- 088 060 030 - 784490145 9 Power_On_Hours -O--CK 046 046 000 - 48138 10 Spin_Retry_Count PO--C- 100 100 097 - 0 12 Power_Cycle_Count -O--CK 098 098 020 - 2364 194 Temperature_Celsius -O---K 043 056 000 - 43 (0 6 0 0 0) 195 Hardware_ECC_Recovered -O-RC- 054 047 000 - 61488271 197 Current_Pending_Sector -O--C- 100 100 000 - 3 198 Offline_Uncorrectable ----C- 100 100 000 - 3 199 UDMA_CRC_Error_Count -OSRCK 200 200 000 - 0 200 Multi_Zone_Error_Rate ------ 100 253 000 - 0 202 Data_Address_Mark_Errs -O--CK 100 253 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory not supported SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 5 Comprehensive SMART error log 0x03 SL R/O 5 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 SL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x20 SL R/O 1 Streaming performance log [OBS-8] 0x21 SL R/O 1 Write stream error log 0x22 SL R/O 1 Read stream error log 0x23 SL R/O 1 Delayed sector log [OBS-8] 0x80-0x9f SL R/W 16 Host vendor specific log 0xa0 SL VS 1 Device vendor specific log 0xa1 SL VS 20 Device vendor specific log 0xa2 SL VS 101 Device vendor specific log 0xa8 SL VS 20 Device vendor specific log 0xa9 SL VS 1 Device vendor specific log 0xe0 SL R/W 1 SCT Command/Status 0xe1 SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 ATA Error Count: 72 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 72 occurred at disk power-on lifetime: 43368 hours (1807 days + 0 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 88 67 95 2b e0 Error: UNC 136 sectors at LBA = 0x002b9567 = 2856295 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 00 df 94 2b e0 00 00:57:13.588 READ DMA EXT 25 00 00 df 93 2b e0 00 00:57:13.585 READ DMA EXT 25 00 00 df 92 2b e0 00 00:57:13.584 READ DMA EXT 25 00 00 df 91 2b e0 00 00:57:13.583 READ DMA EXT 35 00 80 5f b2 f6 e0 00 00:57:14.058 WRITE DMA EXT Error 71 occurred at disk power-on lifetime: 41966 hours (1748 days + 14 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 67 81 21 e0 Error: UNC 8 sectors at LBA = 0x00218167 = 2195815 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 20 5f 81 21 e0 00 00:28:24.182 READ DMA EXT 25 00 3e 87 49 57 e0 00 00:28:24.171 READ DMA EXT 35 00 20 7f 3b b6 e0 00 00:28:24.171 WRITE DMA EXT 25 00 40 b7 48 57 e0 00 00:28:24.170 READ DMA EXT 35 00 20 ff 6a b6 e0 00 00:28:24.165 WRITE DMA EXT Error 70 occurred at disk power-on lifetime: 18892 hours (787 days + 4 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 36 b7 01 62 e0 Error: UNC 54 sectors at LBA = 0x006201b7 = 6422967 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 20 3e 81 01 62 e0 00 00:00:17.033 READ DMA EXT 25 20 02 7f 01 62 e0 00 00:00:17.032 READ DMA EXT 25 20 3b 84 42 51 e0 00 00:00:17.032 READ DMA EXT 25 20 05 7f 42 51 e0 00 00:00:17.031 READ DMA EXT 25 20 02 ff fd 50 e0 00 00:00:17.031 READ DMA EXT Error 69 occurred at disk power-on lifetime: 18876 hours (786 days + 12 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 01 1f f4 09 e0 Error: UNC at LBA = 0x0009f41f = 652319 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 42 00 01 1f f4 09 e0 00 00:21:42.234 READ VERIFY SECTOR(S) EXT 25 00 01 00 00 00 e0 00 00:21:42.221 READ DMA EXT 42 00 02 21 f4 09 e0 00 00:21:42.208 READ VERIFY SECTOR(S) EXT 25 00 01 00 00 00 e0 00 00:21:42.193 READ DMA EXT 42 00 02 1f f4 09 e0 00 00:21:52.569 READ VERIFY SECTOR(S) EXT Error 68 occurred at disk power-on lifetime: 18876 hours (786 days + 12 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 02 1f f4 09 e0 Error: UNC at LBA = 0x0009f41f = 652319 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 42 00 02 1f f4 09 e0 00 00:21:42.234 READ VERIFY SECTOR(S) EXT 42 00 04 23 f4 09 e0 00 00:21:42.221 READ VERIFY SECTOR(S) EXT 25 00 01 00 00 00 e0 00 00:21:42.208 READ DMA EXT 42 00 04 1f f4 09 e0 00 00:21:42.193 READ VERIFY SECTOR(S) EXT 25 00 01 00 00 00 e0 00 00:21:38.820 READ DMA EXT SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 48068 - # 2 Short offline Completed without error 00% 2 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) not supported