/dev/ada0 smartctl 7.4 2023-08-01 r5530 [FreeBSD 14.2-RELEASE amd64] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: HP SSD S700 250GB Serial Number: -- Firmware Version: S0704A1 User Capacity: 250,059,350,016 bytes [250 GB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: Not in smartctl database 7.3/5528 ATA Version is: ACS-2 T13/2015-D revision 3 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 3.0 Gb/s) Local Time is: Thu Feb 13 16:56:06 2025 PST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 128 (minimum power consumption without standby) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 10) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0 5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0 9 Power_On_Hours -O--CK 100 100 000 - 27842 12 Power_Cycle_Count -O--CK 100 100 000 - 2000 171 Unknown_Attribute -O--CK 100 100 000 - 0 172 Unknown_Attribute -O--CK 100 100 000 - 0 173 Unknown_Attribute -O--CK 100 100 005 - 161 174 Unknown_Attribute -O--CK 100 100 000 - 162 176 Erase_Fail_Count_Chip -O---K 100 100 000 - 100 183 Runtime_Bad_Block -O--CK 100 100 000 - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 0 194 Temperature_Celsius -O---K 100 100 000 - 47 198 Offline_Uncorrectable ----CK 100 100 000 - 0 199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0 241 Total_LBAs_Written -O--CK 100 100 000 - 8165 242 Total_LBAs_Read -O--CK 100 100 000 - 8502 243 Unknown_Attribute -O--CK 100 100 000 - 9339 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xde GPL VS 8 Device vendor specific log SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 6 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 2000 --- Lifetime Power-On Resets 0x01 0x010 4 27842 --- Power-on Hours 0x01 0x018 6 4238776870 --- Logical Sectors Written 0x01 0x020 6 100184 --- Number of Write Commands 0x01 0x028 6 651999773 --- Logical Sectors Read 0x01 0x030 6 74059 --- Number of Read Commands 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 3 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x0002 4 0 R_ERR response for data FIS 0x0005 4 0 R_ERR response for non-data FIS 0x000a 4 64 Device-to-host register FISes sent due to a COMRESET