/dev/sd0 smartctl 7.3 2022-02-28 r5338 [NetBSD 10.1_STABLE amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Vendor: StoreJet Product: Transcend Revision: 0 Compliance: SPC-4 User Capacity: 256,060,514,304 bytes [256 GB] Logical block size: 512 bytes Logical Unit id: 0x5000000000000001 Serial number: -- Device type: disk Local Time is: Mon Apr 14 21:47:23 2025 EEST SMART support is: Available - device has SMART capability. SMART support is: Enabled Temperature Warning: Disabled or Not Supported === START OF READ SMART DATA SECTION === SMART Health Status: OK Current Drive Temperature: 0 C Drive Trip Temperature: 0 C Error Counter logging not supported Device does not support Self Test logging /dev/wd0 smartctl 7.3 2022-02-28 r5338 [NetBSD 10.1_STABLE amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Silicon Motion based SSDs Device Model: ADATA SU650 Serial Number: -- LU WWN Device Id: 0 000000 ... Firmware Version: V8X04c26 User Capacity: 240,057,409,536 bytes [240 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic Device is: In smartctl database 7.3/5319 ATA Version is: ACS-3, ATA8-ACS T13/1699-D revision 6 SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Mon Apr 14 21:47:23 2025 EEST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 1) seconds. Offline data collection capabilities: (0x59) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 2) minutes. SCT capabilities: (0x0039) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 100 100 050 Pre-fail Always - 0 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 10759 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 278 161 Valid_Spare_Block_Cnt 0x0032 100 100 000 Old_age Always - 0 162 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 3652 163 Initial_Bad_Block_Count 0x0032 100 100 000 Old_age Always - 3000 164 Total_Erase_Count 0x0032 100 100 000 Old_age Always - 7 166 Min_Erase_Count 0x0032 100 100 000 Old_age Always - 58 167 Average_Erase_Count 0x0032 100 100 050 Old_age Always - 0 168 Max_Erase_Count_of_Spec 0x0032 100 100 000 Old_age Always - 0 169 Remaining_Lifetime_Perc 0x0032 100 100 000 Old_age Always - 100 171 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0 172 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0 174 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 67 175 Program_Fail_Count_Chip 0x0032 100 100 000 Old_age Always - 0 181 Program_Fail_Cnt_Total 0x0022 100 100 000 Old_age Always - 6333737 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0 194 Temperature_Celsius 0x0022 100 100 030 Old_age Always - 29 195 Hardware_ECC_Recovered 0x003a 100 100 000 Old_age Always - 9567 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 199 UDMA_CRC_Error_Count 0x0032 100 100 000 Old_age Always - 0 206 Unknown_SSD_Attribute 0x0032 100 100 000 Old_age Always - 0 207 Unknown_SSD_Attribute 0x0032 100 100 000 Old_age Always - 15 232 Available_Reservd_Space 0x0032 100 100 000 Old_age Always - 100 233 Media_Wearout_Indicator 0x0032 100 100 000 Old_age Always - 380 241 Host_Writes_32MiB 0x0032 100 100 000 Old_age Always - 1385 242 Host_Reads_32MiB 0x0032 100 100 000 Old_age Always - 767 249 Unkn_SiliconMotion_Attr 0x0032 100 100 000 Old_age Always - 1039 250 Read_Error_Retry_Rate 0x0032 100 100 000 Old_age Always - 1595 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.