Probe #50ff0c14dd of ASUSTek TUF Gaming B560M-PLU... Desktop Computer

Log: smartctl

/dev/ada0 smartctl 7.2 2021-09-14 r5236 [MidnightBSD 2.1.5 amd64] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: Seagate FireCuda 120 SSD ZA500GM10001 Serial Number: -- LU WWN Device Id: 5 000c50 ... Firmware Version: SU3SC013 User Capacity: 500,107,862,016 bytes [500 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-3 (minor revision not indicated) SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sat Apr 22 20:07:57 2023 EDT SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 30) seconds. Offline data collection capabilities: (0x79) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 2) minutes. Conveyance self-test routine recommended polling time: ( 3) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0 9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 5514 12 Power_Cycle_Count 0x0012 100 100 000 Old_age Always - 26 16 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 2726 17 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 2726 168 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0 170 Unknown_Attribute 0x0003 100 100 010 Pre-fail Always - 249 173 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 1 174 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 9 177 Wear_Leveling_Count 0x0000 100 100 000 Old_age Offline - 0 192 Power-Off_Retract_Count 0x0012 100 100 000 Old_age Always - 9 194 Temperature_Celsius 0x0023 107 091 000 Pre-fail Always - 20 (Min/Max 19/36) 218 Unknown_Attribute 0x000b 100 100 050 Pre-fail Always - 0 231 Unknown_SSD_Attribute 0x0013 100 100 000 Pre-fail Always - 100 232 Available_Reservd_Space 0x0013 100 100 000 Pre-fail Always - 0 233 Media_Wearout_Indicator 0x000b 100 100 000 Pre-fail Always - 140 234 Unknown_Attribute 0x000b 100 100 000 Pre-fail Always - 68228928 235 Unknown_Attribute 0x000b 100 100 000 Pre-fail Always - 293916928 241 Total_LBAs_Written 0x0012 100 100 000 Old_age Always - 121 242 Total_LBAs_Read 0x0012 100 100 000 Old_age Always - 10 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 285 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. /dev/nvme0 smartctl 7.2 2021-09-14 r5236 [MidnightBSD 2.1.5 amd64] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Number: WD_BLACK SN770 2TB Serial Number: -- Firmware Version: 731100WD PCI Vendor/Subsystem ID: 0x15b7 IEEE OUI Identifier: 0x001b44 Total NVM Capacity: 2,000,398,934,016 [2.00 TB] Unallocated NVM Capacity: 0 Controller ID: 0 NVMe Version: 1.4 Number of Namespaces: 1 Namespace 1 Size/Capacity: 2,000,398,934,016 [2.00 TB] Namespace 1 Formatted LBA Size: 512 Namespace 1 IEEE EUI-64: 001b44 ... Local Time is: Sat Apr 22 20:07:57 2023 EDT Firmware Updates (0x14): 2 Slots, no Reset required Optional Admin Commands (0x0017): Security Format Frmw_DL Self_Test Optional NVM Commands (0x00df): Comp Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat Timestmp Verify Log Page Attributes (0x7e): Cmd_Eff_Lg Ext_Get_Lg Telmtry_Lg Pers_Ev_Lg *Other* Maximum Data Transfer Size: 256 Pages Warning Comp. Temp. Threshold: 84 Celsius Critical Comp. Temp. Threshold: 88 Celsius Namespace 1 Features (0x02): NA_Fields Supported Power States St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat 0 + 5.40W 5.40W - 0 0 0 0 0 0 1 + 3.50W 3.00W - 0 0 0 0 0 0 2 + 2.40W 2.00W - 0 0 0 0 0 0 3 - 0.0150W - - 3 3 3 3 1500 2500 4 - 0.0050W - - 4 4 4 4 10000 6000 5 - 0.0033W - - 5 5 5 5 176000 25000 Supported LBA Sizes (NSID 0x1) Id Fmt Data Metadt Rel_Perf 0 + 512 0 2 1 - 4096 0 1 === START OF SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED SMART/Health Information (NVMe Log 0x02) Critical Warning: 0x00 Temperature: 30 Celsius Available Spare: 100% Available Spare Threshold: 10% Percentage Used: 0% Data Units Read: 2 [1.02 MB] Data Units Written: 0 Host Read Commands: 159 Host Write Commands: 0 Controller Busy Time: 0 Power Cycles: 7 Power On Hours: 0 Unsafe Shutdowns: 2 Media and Data Integrity Errors: 0 Error Information Log Entries: 0 Warning Comp. Temperature Time: 0 Critical Comp. Temperature Time: 0 Temperature Sensor 1: 49 Celsius Temperature Sensor 2: 30 Celsius Error Information (NVMe Log 0x01, 16 of 256 entries) No Errors Logged


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