Probe #4db41bab3d of HP EliteBook Folio 9470...
Log: smartctl
/dev/ada0
smartctl 7.5 2025-04-30 r5714 [FreeBSD 14.3-RELEASE-p2 amd64] (local build)
Copyright (C) 2002-25, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: Acer SSD RE100 2.5 256GB
Serial Number: --
LU WWN Device Id: 5 000000 ...
Firmware Version: SN21046
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: Not in smartctl database 7.5/5706
ATA Version is: ACS-4 (minor revision not indicated)
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed Sep 17 20:31:11 2025 +07
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is: Unavailable
APM feature is: Unavailable
Rd look-ahead is: Enabled
Write cache is: Enabled
DSN feature is: Unavailable
ATA Security is: Disabled, frozen [SEC2]
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 33) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SCT capabilities: (0x0031) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 20
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE
5 Reallocated_Sector_Ct PO--C- 100 100 050 - 0
9 Power_On_Hours -O--C- 100 100 000 - 111
12 Power_Cycle_Count -O--C- 100 100 000 - 20
167 Unknown_Attribute -O---K 100 100 000 - 0
168 Unknown_Attribute -O--C- 100 100 000 - 0
169 Unknown_Attribute PO--C- 100 100 010 - 23199846
171 Unknown_Attribute -O--CK 000 000 000 - 0
172 Unknown_Attribute -O--CK 000 000 000 - 0
173 Unknown_Attribute -O--C- 200 200 000 - 4295819268
175 Program_Fail_Count_Chip -O---K 100 100 010 - 0
177 Wear_Leveling_Count -O--C- 100 100 000 - 4
180 Unused_Rsvd_Blk_Cnt_Tot PO--CK 100 100 000 - 846
187 Reported_Uncorrect -O--CK 100 000 000 - 0
192 Power-Off_Retract_Count -O--C- 100 100 000 - 11
194 Temperature_Celsius -O---K 030 030 000 - 30 (Min/Max 10/50)
196 Reallocated_Event_Count -O--C- 100 100 000 - 0
199 UDMA_CRC_Error_Count -O--C- 100 100 000 - 0
206 Unknown_SSD_Attribute -O--CK 200 200 000 - 1
207 Unknown_SSD_Attribute -O--CK 200 200 000 - 13
208 Unknown_SSD_Attribute -O--CK 200 200 000 - 4
209 Unknown_SSD_Attribute -O--CK 200 200 000 - 0
210 Unknown_Attribute -O--CK 200 200 000 - 0
211 Unknown_Attribute -O--CK 200 200 000 - 0
231 Unknown_SSD_Attribute PO---K 100 100 005 - 0
241 Total_LBAs_Written -O--CK 100 100 000 - 309
242 Total_LBAs_Read -O--CK 100 100 000 - 72
245 Unknown_Attribute -O--CK 100 100 000 - 0
||||||_ K auto-keep
|||||__ C event count
||||___ R error rate
|||____ S speed/performance
||_____ O updated online
|______ P prefailure warning
General Purpose Log Directory Version 1
SMART Log Directory Version 1 [multi-sector log support]
Address Access R/W Size Description
0x00 GPL,SL R/O 1 Log Directory
0x01 SL R/O 1 Summary SMART error log
0x02 SL R/O 51 Comprehensive SMART error log
0x03 GPL R/O 64 Ext. Comprehensive SMART error log
0x04 GPL,SL R/O 8 Device Statistics log
0x06 SL R/O 1 SMART self-test log
0x07 GPL R/O 1 Extended self-test log
0x09 SL R/W 1 Selective self-test log
0x10 GPL R/O 1 NCQ Command Error log
0x11 GPL R/O 1 SATA Phy Event Counters log
0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log
0x80-0x9f GPL,SL R/W 16 Host vendor specific log
0xe0 GPL,SL R/W 1 SCT Command/Status
0xe1 GPL,SL R/W 1 SCT Data Transfer
SMART Extended Comprehensive Error Log Version: 1 (64 sectors)
No Errors Logged
SMART Extended Self-test Log Version: 1 (1 sectors)
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
SCT Status Version: 3
SCT Version (vendor specific): 1 (0x0001)
Device State: Active (0)
Current Temperature: 30 Celsius
Power Cycle Min/Max Temperature: ?/30 Celsius
Lifetime Min/Max Temperature: ?/ ? Celsius
Under/Over Temperature Limit Count: 0/0
SCT Temperature History Version: 2
Temperature Sampling Period: 1 minute
Temperature Logging Interval: 1 minute
Min/Max recommended Temperature: -127/127 Celsius
Min/Max Temperature Limit: -127/127 Celsius
Temperature History Size (Index): 478 (314)
Index Estimated Time Temperature Celsius
315 2025-09-17 12:34 30 ***********
... ..(425 skipped). .. ***********
263 2025-09-17 19:40 30 ***********
264 2025-09-17 19:41 ? -
265 2025-09-17 19:42 30 ***********
... ..( 17 skipped). .. ***********
283 2025-09-17 20:00 30 ***********
284 2025-09-17 20:01 ? -
285 2025-09-17 20:02 30 ***********
... ..( 8 skipped). .. ***********
294 2025-09-17 20:11 30 ***********
295 2025-09-17 20:12 ? -
296 2025-09-17 20:13 30 ***********
... ..( 17 skipped). .. ***********
314 2025-09-17 20:31 30 ***********
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 20 --- Lifetime Power-On Resets
0x01 0x010 4 111 --- Power-on Hours
0x01 0x018 6 649745666 --- Logical Sectors Written
0x01 0x020 6 23149301 --- Number of Write Commands
0x01 0x028 6 152669991 --- Logical Sectors Read
0x01 0x030 6 2443189 --- Number of Read Commands
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 0 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c) not supported
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 2 0 Command failed due to ICRC error
0x0003 2 0 R_ERR response for device-to-host data FIS
0x0004 2 0 R_ERR response for host-to-device data FIS
0x0006 2 0 R_ERR response for device-to-host non-data FIS
0x0007 2 0 R_ERR response for host-to-device non-data FIS
0x0008 2 0 Device-to-host non-data FIS retries
0x0009 4 0 Transition from drive PhyRdy to drive PhyNRdy
0x000a 4 8 Device-to-host register FISes sent due to a COMRESET
0x000f 2 0 R_ERR response for host-to-device data FIS, CRC
0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC
0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC
0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC