Probe #45c45d492a of HP 1494 Desktop Computer (Compaq 8200 Elite CMT PC)

Log: smartctl

/dev/ada0 smartctl 7.4 2023-08-01 r5530 [FreeBSD 13.2-RELEASE-p7 amd64] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: SK hynix SATA SSDs Device Model: SK hynix SC313 HFS256G32TNF-N3A0A Serial Number: -- LU WWN Device Id: 5 ace42e ... Firmware Version: 70000P10 User Capacity: 256,060,514,304 bytes [256 GB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: In smartctl database 7.3/5528 ATA Version is: ACS-3 (minor revision not indicated) SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Thu Jan 18 18:38:15 2024 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Disabled Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Disabled ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unknown === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x02) Offline data collection activity was completed without error. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 110) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 40) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 32 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 100 100 050 - 560 5 Retired_Block_Count PO--CK 097 097 005 - 1 9 Power_On_Hours -O--CK 100 100 000 - 37187 12 Power_Cycle_Count -O--CK 100 100 000 - 149 100 Total_Erase_Count -O--CK 100 100 000 - 394096 168 Min_Erase_Count -O--CK 100 100 000 - 1 169 Max_Erase_Count -O--CK 097 097 000 - 52 171 Program_Fail_Count -O--CK 100 100 000 - 0 172 Erase_Fail_Count -O--CK 100 100 000 - 0 173 Wear_Leveling_Count -O--CK 100 100 005 - 14 174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 39 175 Program_Fail_Count_Chip -O--CK 100 100 000 - 0 176 Unused_Rsvd_Blk_Cnt_Tot -O---K 100 100 000 - 270 178 Used_Rsvd_Blk_Cnt_Chip -O--CK 100 100 000 - 172 179 Used_Rsvd_Blk_Cnt_Tot -O--CK 100 100 000 - 462 180 Erase_Fail_Count -O--CK 100 100 000 - 0 181 Non4k_Aligned_Access -O---K 087 047 000 - 74818078 183 SATA_Downshift_Count -O--CK 100 100 000 - 0 184 End-to-End_Error PO-RCK 100 100 097 - 434 187 Reported_Uncorrect -O--CK 100 100 000 - 560 188 Command_Timeout -O--CK 100 100 000 - 0 194 Temperature_Celsius -O---K 027 054 000 - 27 (Min/Max 14/54) 196 Reallocated_Event_Count -O--CK 100 097 036 - 1 198 Offline_Uncorrectable ----CK 100 100 000 - 2448 199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0 201 Percent_Lifetime_Remain PO---K 100 100 005 - 4128782 212 Phy_Error_Count -O--CK 100 100 000 - 295 241 Total_Writes_GB -O--CK 100 100 000 - 398643 242 Total_Reads_GB -O--CK 100 100 000 - 843481 243 Total_Media_Writes -O--CK 100 100 000 - 225204 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 4 Comprehensive SMART error log 0x03 GPL R/O 5 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x0a GPL R/W 3 Device Statistics Notification 0x0d GPL R/O 8 LPS Mis-alignment log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL R/O 8 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (5 sectors) Device Error Count: 1 CR = Command Register FEATR = Features Register COUNT = Count (was: Sector Count) Register LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8 LH = LBA High (was: Cylinder High) Register ] LBA LM = LBA Mid (was: Cylinder Low) Register ] Register LL = LBA Low (was: Sector Number) Register ] DV = Device (was: Device/Head) Register DC = Device Control Register ER = Error register ST = Status register Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 1 [0] occurred at disk power-on lifetime: 25836 hours (1076 days + 12 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER -- ST COUNT LBA_48 LH LM LL DV DC -- -- -- == -- == == == -- -- -- -- -- 40 -- 41 00 00 00 00 00 00 00 00 00 00 Error: UNC at LBA = 0x00000000 = 0 Commands leading to the command that caused the error were: CR FEATR COUNT LBA_48 LH LM LL DV DC Powered_Up_Time Command/Feature_Name -- == -- == -- == == == -- -- -- -- -- --------------- -------------------- 60 00 20 00 80 00 00 07 62 14 20 40 40 7d+11:02:53.012 READ FPDMA QUEUED 60 00 20 00 78 00 00 07 62 14 00 40 40 7d+11:02:53.012 READ FPDMA QUEUED 60 00 20 00 70 00 00 07 62 13 e0 40 40 7d+11:02:53.012 READ FPDMA QUEUED 60 00 20 00 68 00 00 07 62 13 c0 40 40 7d+11:02:53.002 READ FPDMA QUEUED 60 00 20 00 60 00 00 07 62 13 a0 40 40 7d+11:02:53.002 READ FPDMA QUEUED Warning! SMART Extended Self-test Log Structure error: invalid SMART checksum. SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Vendor (0x50) Completed without error 00% 37187 - Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum. SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 1 (0x0001) Device State: Active (0) Current Temperature: 27 Celsius Power Cycle Min/Max Temperature: 19/27 Celsius Lifetime Min/Max Temperature: 14/54 Celsius Specified Max Operating Temperature: 80 Celsius Under/Over Temperature Limit Count: 631/0 SCT Temperature History Version: 2 Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: -20/80 Celsius Min/Max Temperature Limit: -20/125 Celsius Temperature History Size (Index): 192 (176) Index Estimated Time Temperature Celsius 177 2024-01-18 15:27 27 ******** 178 2024-01-18 15:28 27 ******** 179 2024-01-18 15:29 27 ******** 180 2024-01-18 15:30 26 ******* 181 2024-01-18 15:31 26 ******* 182 2024-01-18 15:32 26 ******* 183 2024-01-18 15:33 27 ******** 184 2024-01-18 15:34 27 ******** 185 2024-01-18 15:35 26 ******* ... ..( 51 skipped). .. ******* 45 2024-01-18 16:27 26 ******* 46 2024-01-18 16:28 27 ******** ... ..( 8 skipped). .. ******** 55 2024-01-18 16:37 27 ******** 56 2024-01-18 16:38 ? - ... ..( 6 skipped). .. - 63 2024-01-18 16:45 ? - 64 2024-01-18 16:46 27 ******** ... ..(111 skipped). .. ******** 176 2024-01-18 18:38 27 ******** SCT Error Recovery Control: Read: 80 (8.0 seconds) Write: 80 (8.0 seconds) Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 2) == 0x01 0x008 4 149 -D- Lifetime Power-On Resets 0x01 0x010 4 37187 -D- Power-on Hours 0x01 0x018 6 398643 --- Logical Sectors Written 0x01 0x020 6 398643 --- Number of Write Commands 0x01 0x028 6 843481 --- Logical Sectors Read 0x01 0x030 6 225204 --- Number of Read Commands 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 560 -D- Number of Reported Uncorrectable Errors 0x04 0x010 4 0 -D- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 27 -D- Current Temperature 0x05 0x020 1 54 -D- Highest Temperature 0x05 0x028 1 14 -D- Lowest Temperature 0x05 0x038 1 0 -D- Lowest Average Short Term Temperature 0x05 0x058 1 80 --- Specified Maximum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 509 -D- Number of Hardware Resets 0x06 0x010 4 368 -D- Number of ASR Events 0x06 0x018 4 0 -D- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 14 -D- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x000a 2 6 Device-to-host register FISes sent due to a COMRESET


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