/dev/ada0 smartctl 7.5 2025-04-30 r5714 [FreeBSD 14.3-RELEASE-p2 amd64] (local build) Copyright (C) 2002-25, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Silicon Motion based SSDs Device Model: ADATA SU650 Serial Number: -- LU WWN Device Id: 0 000000 ... Firmware Version: V8X01c45 User Capacity: 120,034,123,776 bytes [120 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: In smartctl database 7.5/5706 ATA Version is: ACS-3, ATA8-ACS T13/1699-D revision 6 SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue Sep 16 11:02:45 2025 EEST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 1) seconds. Offline data collection capabilities: (0x59) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 3) minutes. Extended self-test routine recommended polling time: ( 11) minutes. SCT capabilities: (0x0039) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 100 100 000 - 8135 12 Power_Cycle_Count -O--CK 100 100 000 - 4605 161 Valid_Spare_Block_Cnt -O--CK 100 100 000 - 0 162 Cache_Block_Count -O--CK 100 100 000 - 259538 163 Initial_Bad_Block_Count -O--CK 100 100 000 - 100 164 Total_Erase_Count -O--CK 100 100 000 - 558 166 Min_Erase_Count -O--CK 100 100 000 - 122 167 Average_Erase_Count -O--CK 100 100 050 - 0 168 Max_Erase_Count_of_Spec -O--CK 100 100 000 - 0 169 Remaining_Lifetime_Perc -O--CK 100 100 000 - 100 171 Unknown_Attribute -O--CK 100 100 000 - 0 172 Unknown_Attribute -O--CK 100 100 000 - 0 174 Unknown_Attribute -O--CK 100 100 000 - 1598 175 Program_Fail_Count_Chip -O--CK 100 100 000 - 0 181 Program_Fail_Cnt_Total -O---K 100 100 000 - 288477842 187 Reported_Uncorrect -O--CK 100 100 000 - 0 194 Temperature_Celsius -O---K 100 100 030 - 54 195 Hardware_ECC_Recovered -O-RCK 100 100 000 - 0 196 Reallocated_Event_Count -O--CK 100 100 000 - 0 199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0 206 Unknown_SSD_Attribute -O--CK 100 100 000 - 445 207 Unknown_SSD_Attribute -O--CK 100 100 000 - 577 232 Available_Reservd_Space -O--CK 100 100 000 - 100 241 Host_Writes_32MiB -O--CK 100 100 000 - 15544 242 Host_Reads_32MiB -O--CK 100 100 000 - 23659 249 Unkn_SiliconMotion_Attr -O--CK 100 100 000 - 7544 250 Read_Error_Retry_Rate -O--CK 100 100 000 - 17995 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 2 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 5 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 8 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (2 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 6202 - # 2 Short offline Completed without error 00% 5561 - # 3 Short offline Completed without error 00% 4855 - # 4 Short offline Completed without error 00% 4553 - SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 0 (0x0000) Device State: Active (0) Current Temperature: 0 Celsius Power Cycle Min/Max Temperature: 28/28 Celsius Lifetime Min/Max Temperature: 0/37 Celsius Specified Max Operating Temperature: 100 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 0 minutes Temperature Logging Interval: 0 minutes Min/Max recommended Temperature: 0/100 Celsius Min/Max Temperature Limit: -10/125 Celsius Temperature History Size (Index): 128 (2) Index Estimated Time Temperature Celsius 3 2025-09-16 08:55 ? - ... ..(123 skipped). .. - 127 2025-09-16 10:59 ? - 0 2025-09-16 11:00 36 ***************** 1 2025-09-16 11:01 ? - 2 2025-09-16 11:02 38 ******************* SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 4605 --- Lifetime Power-On Resets 0x01 0x010 4 8135 --- Power-on Hours 0x01 0x018 6 32599407970 --- Logical Sectors Written 0x01 0x020 6 454550864 --- Number of Write Commands 0x01 0x028 6 49618535131 --- Logical Sectors Read 0x01 0x030 6 781392434 --- Number of Read Commands 0x01 0x038 6 29283568549 --- Date and Time TimeStamp 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 16144 --- Resets Between Cmd Acceptance and Completion 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 28026 --- Number of Hardware Resets 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 179 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x000a 4 24 Device-to-host register FISes sent due to a COMRESET