/dev/sd0 smartctl 7.3 2022-02-28 r5338 [OpenBSD 7.2 amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: WD Green 2.5 240GB Serial Number: -- LU WWN Device Id: 5 001b44 ... Firmware Version: 42051100 User Capacity: 240,057,409,536 bytes [240 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic Device is: Not in smartctl database 7.3/5319 ATA Version is: ACS-4, ACS-2 T13/2015-D revision 3 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 3.0 Gb/s) Local Time is: Sun Jan 1 10:06:39 2023 CST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART Status not supported: Incomplete response, ATA output registers missing SMART overall-health self-assessment test result: PASSED Warning: This result is based on an Attribute check. General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x71) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 10) minutes. Conveyance self-test routine recommended polling time: ( 1) minutes. SMART Attributes Data Structure revision number: 0 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 5 Reallocated_Sector_Ct 0x0032 100 100 010 Old_age Always - 11 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 3 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 283 165 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 390851985556 166 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 3 167 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 19 168 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 4 169 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 70 170 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 11 171 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0 172 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0 173 Unknown_Attribute 0x0032 100 100 005 Old_age Always - 3 174 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 1 184 End-to-End_Error 0x0032 100 100 097 Old_age Always - 0 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0 188 Command_Timeout 0x0032 100 100 000 Old_age Always - 0 194 Temperature_Celsius 0x0022 100 100 014 Old_age Always - 38 (Min/Max 15/60) 199 UDMA_CRC_Error_Count 0x0032 100 100 000 Old_age Always - 0 230 Unknown_SSD_Attribute 0x0032 100 100 000 Old_age Always - 158917722149 232 Available_Reservd_Space 0x0033 100 100 000 Pre-fail Always - 94 233 Media_Wearout_Indicator 0x0032 100 100 000 Old_age Always - 256 234 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 1516 241 Total_LBAs_Written 0x0030 253 253 000 Old_age Offline - 858 242 Total_LBAs_Read 0x0030 253 253 000 Old_age Offline - 241 244 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0 Warning! SMART ATA Error Log Structure error: invalid SMART checksum. SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. /dev/sd1 smartctl 7.3 2022-02-28 r5338 [OpenBSD 7.2 amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: TOSHIBA MQ01ACF032 Serial Number: -- LU WWN Device Id: 5 000039 ... Firmware Version: AV001D User Capacity: 320,072,933,376 bytes [320 GB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: 7200 rpm Form Factor: 2.5 inches Device is: Not in smartctl database 7.3/5319 ATA Version is: ATA8-ACS (minor revision not indicated) SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s) Local Time is: Sun Jan 1 10:06:39 2023 CST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART Status not supported: Incomplete response, ATA output registers missing SMART overall-health self-assessment test result: PASSED Warning: This result is based on an Attribute check. General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 69) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 128 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0 3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 1817 5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0 9 Power_On_Hours 0x0032 087 087 000 Old_age Always - 5520 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 1288 191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 571 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 252 193 Load_Cycle_Count 0x0032 095 095 000 Old_age Always - 57580 194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 30 (Min/Max 14/77) 199 UDMA_CRC_Error_Count 0x0032 100 100 000 Old_age Always - 210125365 200 Multi_Zone_Error_Rate 0x0032 100 100 000 Old_age Always - 346924189 240 Head_Flying_Hours 0x0032 088 088 000 Old_age Always - 5061 241 Total_LBAs_Written 0x0032 100 100 000 Old_age Always - 17301581024 242 Total_LBAs_Read 0x0032 100 100 000 Old_age Always - 31057326830 254 Free_Fall_Sensor 0x0032 100 100 000 Old_age Always - 100 SMART Error Log Version: 1 ATA Error Count: 3 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 3 occurred at disk power-on lifetime: 5045 hours (210 days + 5 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 41 50 7f 19 a5 40 Error: ICRC, ABRT at LBA = 0x00a5197f = 10819967 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 60 80 1a a5 40 00 01:02:39.118 READ FPDMA QUEUED 60 00 58 80 19 a5 40 00 01:02:39.111 READ FPDMA QUEUED 60 00 50 80 15 a5 40 00 01:02:39.111 READ FPDMA QUEUED 60 00 48 80 10 a5 40 00 01:02:39.111 READ FPDMA QUEUED 60 80 40 00 10 a5 40 00 01:02:39.103 READ FPDMA QUEUED Error 2 occurred at disk power-on lifetime: 4235 hours (176 days + 11 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 20 40 39 27 e0 Error: UNC 32 sectors at LBA = 0x00273940 = 2570560 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 40 20 39 27 e0 00 01:26:20.115 READ DMA EXT 25 00 40 e0 38 27 e0 00 01:26:20.115 READ DMA EXT 25 00 40 a0 38 27 e0 00 01:26:20.115 READ DMA EXT 25 00 40 60 38 27 e0 00 01:26:20.114 READ DMA EXT 25 00 40 20 38 27 e0 00 01:26:20.114 READ DMA EXT Error 1 occurred at disk power-on lifetime: 4155 hours (173 days + 3 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 30 f8 2a 27 e0 Error: UNC 48 sectors at LBA = 0x00272af8 = 2566904 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 36 f2 2a 27 e0 00 20:09:42.684 READ DMA EXT 25 00 35 bd 2a 27 e0 00 20:09:42.684 READ DMA EXT 25 00 35 88 2a 27 e0 00 20:09:42.684 READ DMA EXT 25 00 30 58 2a 27 e0 00 20:09:42.683 READ DMA EXT 25 00 30 28 2a 27 e0 00 20:09:42.683 READ DMA EXT SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 4874 - # 2 Short offline Completed without error 00% 4850 - # 3 Extended offline Interrupted (host reset) 90% 4574 - # 4 Short offline Completed without error 00% 4572 - # 5 Short offline Completed without error 00% 4569 - # 6 Short offline Completed without error 00% 4554 - # 7 Short offline Completed without error 00% 4552 - # 8 Short offline Completed without error 00% 4549 - # 9 Short offline Completed without error 00% 4548 - #10 Short offline Completed without error 00% 4546 - #11 Short offline Completed without error 00% 4535 - #12 Short offline Completed without error 00% 4532 - #13 Short offline Completed without error 00% 4530 - #14 Short offline Aborted by host 90% 4526 - #15 Short offline Completed without error 00% 4524 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.