Probe #360790274a of HP Notebook

Log: smartctl

/dev/ada0 smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: SAMSUNG MZ7TD256HAFV-000L9 Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: DXT04L6Q User Capacity: 256,060,514,304 bytes [256 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device TRIM Command: Available, deterministic, zeroed Device is: In smartctl database 7.3/5319 ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sat Jul 29 10:58:39 2023 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (53956) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 40) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 9 Power_On_Hours -O--CK 098 098 000 - 7577 12 Power_Cycle_Count -O--CK 098 098 000 - 1854 175 Program_Fail_Count_Chip -O--CK 100 100 010 - 0 176 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0 177 Wear_Leveling_Count PO--C- 091 091 005 - 99 178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 0 180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 6240 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 100 100 010 - 0 184 End-to-End_Error PO--CK 100 100 097 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 190 Airflow_Temperature_Cel -O--CK 074 037 000 - 26 195 ECC_Error_Rate -O-RC- 200 200 000 - 0 198 Offline_Uncorrectable ----CK 100 100 000 - 0 199 CRC_Error_Count -OSRCK 253 253 000 - 0 233 Media_Wearout_Indicator -O-RCK 199 199 000 - 3801461 234 Unknown_Samsung_Attr -O--C- 100 100 000 - 0 235 POR_Recovery_Count -O--C- 099 099 000 - 260 236 Unknown_Samsung_Attr -O--C- 099 099 000 - 43 237 Unknown_Samsung_Attr -O--C- 099 099 000 - 99 238 Unknown_Samsung_Attr -O--C- 100 100 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 GPL,SL R/O 1 Summary SMART error log 0x02 GPL,SL R/O 1 Comprehensive SMART error log 0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log 0x06 GPL,SL R/O 1 SMART self-test log 0x07 GPL,SL R/O 1 Extended self-test log 0x09 GPL,SL R/W 1 Selective self-test log 0x10 GPL,SL R/O 1 NCQ Command Error log 0x11 GPL,SL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xa0 GPL,SL VS 16 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 255 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 256 (0x0100) Device State: SCT command executing in background (5) Current Temperature: 40 Celsius Power Cycle Min/Max Temperature: 40/40 Celsius Lifetime Min/Max Temperature: 0/70 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 3 (Unknown, should be 2) Temperature Sampling Period: 1 minute Temperature Logging Interval: 1 minute Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: 0/70 Celsius Temperature History Size (Index): 128 (0) Index Estimated Time Temperature Celsius 1 2023-07-29 08:51 ? - ... ..(125 skipped). .. - 127 2023-07-29 10:57 ? - 0 2023-07-29 10:58 40 ********************* SCT Error Recovery Control: Read: Disabled Write: Disabled Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 166 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 8 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC /dev/da0 smartctl 7.3 2022-02-28 r5338 [FreeBSD 13.1-RELEASE amd64] (local build) Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: Intenso SSD Sata III Serial Number: -- Firmware Version: T0921A0 User Capacity: 256,060,514,304 bytes [256 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: M.2 TRIM Command: Available Device is: Not in smartctl database 7.3/5319 ATA Version is: ACS-3 T13/2161-D revision 4 SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sat Jul 29 10:58:39 2023 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Disabled Rd look-ahead is: Enabled Write cache is: Disabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x11) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 10) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate -O--CK 100 100 050 - 0 5 Reallocated_Sector_Ct -O--CK 100 100 050 - 0 9 Power_On_Hours -O--CK 100 100 050 - 33 12 Power_Cycle_Count -O--CK 100 100 050 - 193 160 Unknown_Attribute -O--CK 100 100 050 - 0 161 Unknown_Attribute PO--CK 100 100 050 - 100 163 Unknown_Attribute -O--CK 100 100 050 - 7 164 Unknown_Attribute -O--CK 100 100 050 - 825 165 Unknown_Attribute -O--CK 100 100 050 - 8 166 Unknown_Attribute -O--CK 100 100 050 - 2 167 Unknown_Attribute -O--CK 100 100 050 - 5 168 Unknown_Attribute -O--CK 100 100 050 - 2000 169 Unknown_Attribute -O--CK 100 100 050 - 100 175 Program_Fail_Count_Chip -O--CK 100 100 050 - 0 176 Erase_Fail_Count_Chip -O--CK 100 100 050 - 0 177 Wear_Leveling_Count -O--CK 100 100 050 - 0 178 Used_Rsvd_Blk_Cnt_Chip -O--CK 100 100 050 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 050 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 050 - 0 192 Power-Off_Retract_Count -O--CK 100 100 050 - 191 194 Temperature_Celsius -O---K 100 100 050 - 36 195 Hardware_ECC_Recovered -O--CK 100 100 050 - 0 196 Reallocated_Event_Count -O--CK 100 100 050 - 0 197 Current_Pending_Sector -O--CK 100 100 050 - 0 198 Offline_Uncorrectable -O--CK 100 100 050 - 0 199 UDMA_CRC_Error_Count -O--CK 100 100 050 - 2 232 Available_Reservd_Space -O--CK 100 100 050 - 100 241 Total_LBAs_Written ----CK 100 100 050 - 13339 242 Total_LBAs_Read ----CK 100 100 050 - 10206 245 Unknown_Attribute -O--CK 100 100 050 - 8973 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 8 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x24 GPL R/O 88 Current Device Internal Status Data log 0x25 GPL R/O 32 Saved Device Internal Status Data log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log Version: 1 (1 sectors) Device Error Count: 2 CR = Command Register FEATR = Features Register COUNT = Count (was: Sector Count) Register LBA_48 = Upper bytes of LBA High/Mid/Low Registers ] ATA-8 LH = LBA High (was: Cylinder High) Register ] LBA LM = LBA Mid (was: Cylinder Low) Register ] Register LL = LBA Low (was: Sector Number) Register ] DV = Device (was: Device/Head) Register DC = Device Control Register ER = Error register ST = Status register Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 2 [1] log entry is empty Error 1 [0] log entry is empty SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 193 --- Lifetime Power-On Resets 0x01 0x010 4 33 --- Power-on Hours 0x01 0x018 6 874229237 --- Logical Sectors Written 0x01 0x020 6 2702633 --- Number of Write Commands 0x01 0x028 6 668887584 --- Logical Sectors Read 0x01 0x030 6 1437136 --- Number of Read Commands 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 0 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x0002 4 0 R_ERR response for data FIS 0x0005 4 0 R_ERR response for non-data FIS 0x000a 4 0 Device-to-host register FISes sent due to a COMRESET


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