/dev/wd0 smartctl 7.1 2019-12-30 r5022 [NetBSD 9.1 i386] (local build) Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Hitachi Travelstar 5K80 Device Model: HTS548040M9AT00 Serial Number: -- Firmware Version: MG2OA5DA User Capacity: 40,007,761,920 bytes [40.0 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA/ATAPI-6 T13/1410D revision 3a Local Time is: Sat Jan 2 11:24:36 2021 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x85) Offline data collection activity was aborted by an interrupting command from host. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 645) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 30) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 062 Pre-fail Always - 0 2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 340 3 Spin_Up_Time 0x0007 215 215 033 Pre-fail Always - 1 4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 525 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0 7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0 9 Power_On_Hours 0x0012 099 099 000 Old_age Always - 840 10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 328 191 G-Sense_Error_Rate 0x000a 098 098 000 Old_age Always - 131074 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 33 193 Load_Cycle_Count 0x0012 098 098 000 Old_age Always - 22841 194 Temperature_Celsius 0x0002 177 177 000 Old_age Always - 31 (Min/Max 9/49) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 1 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 2 CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 2 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 59 01 0f 8e a8 e4 Error: IDNF at LBA = 0x04a88e0f = 78155279 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 20 ff 01 0f 8e a8 e4 00 00:02:26.800 READ SECTOR(S) c8 ff 01 0f 8e a8 e4 00 00:02:26.700 READ DMA c8 ff 01 00 00 00 e0 00 00:02:26.300 READ DMA 30 00 01 ff 52 a8 e4 02 00:01:16.100 WRITE SECTOR(S) f9 00 01 ff 52 a8 e4 00 00:01:16.000 SET MAX ADDRESS [OBS-6] Error 1 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 01 0f 8e a8 e4 Error: IDNF 1 sectors at LBA = 0x04a88e0f = 78155279 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 ff 01 0f 8e a8 e4 00 00:02:26.700 READ DMA c8 ff 01 00 00 00 e0 00 00:02:26.300 READ DMA 30 00 01 ff 52 a8 e4 02 00:01:16.100 WRITE SECTOR(S) f9 00 01 ff 52 a8 e4 00 00:01:16.000 SET MAX ADDRESS [OBS-6] f8 00 00 00 00 00 e0 00 00:01:16.000 READ NATIVE MAX ADDRESS [OBS-ACS-3] SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum. SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.