/dev/ada0 smartctl 7.2 2021-09-14 r5236 [FreeBSD 14.0-CURRENT amd64] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: ADATA SU760 Serial Number: -- LU WWN Device Id: 5 707c18 ... Firmware Version: XA004R23 User Capacity: 1,024,209,543,168 bytes [1.02 TB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-3, ATA8-ACS T13/1699-D revision 6 SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Sat Jan 8 17:49:45 2022 CST SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 1) seconds. Offline data collection capabilities: (0x59) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 33) minutes. Extended self-test routine recommended polling time: ( 28) minutes. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 100 100 000 - 216 12 Power_Cycle_Count -O--CK 100 100 000 - 29 160 Unknown_Attribute -O--CK 100 100 050 - 0 161 Unknown_Attribute -O--CK 100 100 050 - 100 163 Unknown_Attribute -O--CK 100 100 000 - 213 164 Unknown_Attribute -O--CK 100 100 000 - 54 165 Unknown_Attribute -O--CK 100 100 000 - 2 166 Unknown_Attribute -O--CK 100 100 000 - 0 167 Unknown_Attribute -O--CK 100 100 000 - 0 148 Unknown_Attribute -O--CK 100 100 000 - 162 149 Unknown_Attribute -O--CK 100 100 000 - 7 150 Unknown_Attribute -O--CK 100 100 000 - 0 151 Unknown_Attribute -O--CK 100 100 000 - 0 159 Unknown_Attribute -O--CK 100 100 000 - 0 168 Unknown_Attribute -O--CK 100 100 000 - 7 169 Unknown_Attribute -O--CK 100 100 000 - 100 177 Wear_Leveling_Count -O--CK 100 100 000 - 0 181 Program_Fail_Cnt_Total -O--CK 100 100 000 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 000 - 0 192 Power-Off_Retract_Count -O--CK 100 100 000 - 6 194 Temperature_Celsius -O--CK 100 100 000 - 36 195 Hardware_ECC_Recovered -O--CK 100 100 000 - 0 196 Reallocated_Event_Count -O--CK 100 100 000 - 0 199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0 232 Available_Reservd_Space -O--CK 100 100 000 - 100 241 Total_LBAs_Written -O--CK 100 100 000 - 4390 242 Total_LBAs_Read -O--CK 100 100 000 - 974 245 Unknown_Attribute -O--CK 100 100 000 - 4534 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 2 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 5 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x30 GPL,SL R/O 8 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (2 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 1) == 0x01 0x008 4 29 --- Lifetime Power-On Resets 0x01 0x010 4 216 --- Power-on Hours 0x01 0x018 6 287718075 --- Logical Sectors Written 0x01 0x020 6 5237679 --- Number of Write Commands 0x01 0x028 6 63834338 --- Logical Sectors Read 0x01 0x030 6 4029057 --- Number of Read Commands 0x01 0x038 6 770938370 --- Date and Time TimeStamp 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 318 --- Number of Hardware Resets 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 0 --- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x000a 4 15 Device-to-host register FISes sent due to a COMRESET /dev/nvme0 smartctl 7.2 2021-09-14 r5236 [FreeBSD 14.0-CURRENT amd64] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Number: INTEL SSDPEKKW256G8 Serial Number: -- Firmware Version: 004C PCI Vendor/Subsystem ID: 0x8086 IEEE OUI Identifier: 0x5cd2e4 Controller ID: 1 NVMe Version: 1.3 Number of Namespaces: 1 Namespace 1 Size/Capacity: 256,060,514,304 [256 GB] Namespace 1 Formatted LBA Size: 512 Local Time is: Sat Jan 8 17:49:45 2022 CST Firmware Updates (0x14): 2 Slots, no Reset required Optional Admin Commands (0x0017): Security Format Frmw_DL Self_Test Optional NVM Commands (0x005f): Comp Wr_Unc DS_Mngmt Wr_Zero Sav/Sel_Feat Timestmp Log Page Attributes (0x0f): S/H_per_NS Cmd_Eff_Lg Ext_Get_Lg Telmtry_Lg Maximum Data Transfer Size: 64 Pages Warning Comp. Temp. Threshold: 75 Celsius Critical Comp. Temp. Threshold: 80 Celsius Supported Power States St Op Max Active Idle RL RT WL WT Ent_Lat Ex_Lat 0 + 9.00W - - 0 0 0 0 0 0 1 + 4.60W - - 1 1 1 1 0 0 2 + 3.80W - - 2 2 2 2 0 0 3 - 0.0450W - - 3 3 3 3 2000 2000 4 - 0.0040W - - 4 4 4 4 6000 8000 Supported LBA Sizes (NSID 0x1) Id Fmt Data Metadt Rel_Perf 0 + 512 0 0 === START OF SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED SMART/Health Information (NVMe Log 0x02) Critical Warning: 0x00 Temperature: 29 Celsius Available Spare: 100% Available Spare Threshold: 12% Percentage Used: 4% Data Units Read: 3,533,534 [1.80 TB] Data Units Written: 12,255,331 [6.27 TB] Host Read Commands: 92,518,355 Host Write Commands: 166,866,436 Controller Busy Time: 3,902 Power Cycles: 275 Power On Hours: 2,073 Unsafe Shutdowns: 65 Media and Data Integrity Errors: 0 Error Information Log Entries: 0 Warning Comp. Temperature Time: 0 Critical Comp. Temperature Time: 0 Error Information (NVMe Log 0x01, 16 of 256 entries) No Errors Logged