/dev/sd0c smartctl 7.1 2019-12-30 r5022 [x86_64-unknown-openbsd6.8] (local build) Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: TOSHIBA THNSNC064GBSJ Serial Number: -- Firmware Version: CJTA0202 User Capacity: 64,023,257,088 bytes [64.0 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ATA8-ACS (minor revision not indicated) SATA Version is: SATA 2.6, 3.0 Gb/s (current: 1.5 Gb/s) Local Time is: Thu Jan 28 14:34:24 2021 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART Status not supported: Incomplete response, ATA output registers missing SMART overall-health self-assessment test result: PASSED Warning: This result is based on an Attribute check. General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 7) minutes. SCT capabilities: (0x0039) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000a 099 099 000 Old_age Always - 0 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0 3 Spin_Up_Time 0x0007 100 100 050 Pre-fail Always - 0 5 Reallocated_Sector_Ct 0x0013 100 100 050 Pre-fail Always - 0 7 Unknown_SSD_Attribute 0x000b 100 100 050 Pre-fail Always - 0 8 Unknown_SSD_Attribute 0x0005 100 100 050 Pre-fail Offline - 0 9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 2764 10 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0 12 Power_Cycle_Count 0x0012 100 100 000 Old_age Always - 1638 167 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 0 168 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0 169 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 115998196168 170 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 25786318930 173 Unknown_Attribute 0x0013 195 195 100 Pre-fail Always - 0 175 Program_Fail_Count_Chip 0x0013 100 100 010 Pre-fail Always - 0 192 Power-Off_Retract_Count 0x0012 100 100 000 Old_age Always - 210 194 Temperature_Celsius 0x0023 070 052 030 Pre-fail Always - 30 (Min/Max 12/48) 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0 240 Unknown_SSD_Attribute 0x0013 100 100 050 Pre-fail Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.