/dev/wd0 smartctl 7.4 2023-08-01 r5530 [OpenBSD 7.6 i386] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Fujitsu MHV Device Model: FUJITSU MHV2040AH Serial Number: -- Firmware Version: 00840096 User Capacity: 40,007,761,920 bytes [40.0 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database 7.3/5528 ATA Version is: ATA/ATAPI-6 T13/1410D revision 3a Local Time is: Thu Dec 12 20:09:18 2024 MSK SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 221) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 28) minutes. Conveyance self-test routine recommended polling time: ( 2) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 100 100 046 Pre-fail Always - 3718 2 Throughput_Performance 0x0005 100 100 030 Pre-fail Offline - 12124160 3 Spin_Up_Time 0x0003 100 100 025 Pre-fail Always - 1 4 Start_Stop_Count 0x0032 099 099 000 Old_age Always - 3476 5 Reallocated_Sector_Ct 0x0033 100 100 024 Pre-fail Always - 0 (2000 0) 7 Seek_Error_Rate 0x000f 100 100 047 Pre-fail Always - 4070 8 Seek_Time_Performance 0x0005 100 100 019 Pre-fail Offline - 0 9 Power_On_Seconds 0x0032 070 070 000 Old_age Always - 15141h+12m+57s 10 Spin_Retry_Count 0x0013 100 100 020 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 2370 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 128 193 Load_Cycle_Count 0x0032 084 084 000 Old_age Always - 321713 194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 40 (Min/Max 10/48) 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 0 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 (0 7008) 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x000f 100 100 060 Pre-fail Always - 21445 203 Run_Out_Cancel 0x0002 100 100 000 Old_age Always - 429546929779 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. The above only provides legacy SMART information - try 'smartctl -x' for more