/dev/ada0 smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE amd64] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: SAMSUNG SSD RBX Series 64GB M Serial Number: -- LU WWN Device Id: 5 0000f0 ... Firmware Version: VAM05D1Q User Capacity: 64,023,257,088 bytes [64.0 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device TRIM Command: Unavailable Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ATA/ATAPI-7 T13/1532D revision 1 Local Time is: Wed Aug 18 03:03:05 2021 EDT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Disabled APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x02) Offline data collection activity was completed without error. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 12) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 9 Power_On_Hours -O--CK 098 098 000 - 7127 12 Power_Cycle_Count -O--CK 097 097 000 - 2453 175 Program_Fail_Count_Chip -O--CK 100 100 012 - 0 176 Erase_Fail_Count_Chip -O--CK 100 100 012 - 0 177 Wear_Leveling_Count PO--C- 100 100 023 - 0 178 Used_Rsvd_Blk_Cnt_Chip PO--C- 069 069 012 - 19 179 Used_Rsvd_Blk_Cnt_Tot PO--C- 098 098 010 - 55 180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 049 049 010 - 1929 181 Program_Fail_Cnt_Total -O--CK 100 100 010 - 0 182 Erase_Fail_Count_Total -O--CK 100 100 010 - 0 183 Runtime_Bad_Block PO--C- 100 100 010 - 0 187 Reported_Uncorrect PO--CK 100 100 000 - 0 195 Hardware_ECC_Recovered -O-RC- 200 200 000 - 0 198 Offline_Uncorrectable ----CK 100 100 000 - 0 199 UDMA_CRC_Error_Count -OSRCK 253 253 000 - 0 232 Available_Reservd_Space PO--C- 070 070 012 - 43 233 Media_Wearout_Indicator -O--CK 005 005 000 - 4098570392 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 0 Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 GPL,SL R/O 1 Summary SMART error log 0x02 GPL,SL R/O 1 Comprehensive SMART error log 0x03 GPL,SL R/O 1 Ext. Comprehensive SMART error log 0x06 GPL,SL R/O 1 SMART self-test log 0x07 GPL,SL R/O 1 Extended self-test log 0x09 GPL,SL R/W 1 Selective self-test log 0x11 GPL,SL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 1 Host vendor specific log SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged Warning! SMART Extended Self-test Log Structure error: invalid SMART checksum. SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 7095 - # 2 Short offline Completed without error 00% 7087 - # 3 Short offline Completed without error 00% 6959 - # 4 Short offline Completed without error 00% 6951 - # 5 Short offline Completed without error 00% 6943 - # 6 Extended offline Completed without error 00% 6936 - # 7 Extended offline Completed without error 00% 6925 - # 8 Short offline Completed without error 00% 2842 - # 9 Short offline Completed without error 00% 995 - #10 Short offline Completed without error 00% 2 - #11 Short offline Completed without error 00% 0 - #12 Short offline Interrupted (host reset) 50% 0 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 13 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 13 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC /dev/da0 smartctl 7.2 2020-12-30 r5155 [FreeBSD 12.2-RELEASE amd64] (local build) Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Seagate Samsung SpinPoint M8 (AF) Device Model: ST500LM012 HN-M500MBB Serial Number: -- LU WWN Device Id: 5 0004cf ... Firmware Version: 2AR20003 User Capacity: 500,107,862,016 bytes [500 GB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: 5400 rpm Form Factor: 2.5 inches Device is: In smartctl database [for details use: -P show] ATA Version is: ATA8-ACS T13/1699-D revision 6 SATA Version is: SATA 3.0, 3.0 Gb/s (current: 1.5 Gb/s) Local Time is: Wed Aug 18 03:03:05 2021 EDT SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Disabled APM feature is: Disabled Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, NOT FROZEN [SEC1] Write SCT (Get) Feature Control Command failed: Read of ATA output registers not implemented [JMicron] Wt Cache Reorder: Unknown (SCT Feature Control command failed) === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 6360) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 106) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 100 100 051 - 37 2 Throughput_Performance -OS--K 056 056 000 - 5786 3 Spin_Up_Time PO---K 091 090 025 - 2855 4 Start_Stop_Count -O--CK 098 098 000 - 2626 5 Reallocated_Sector_Ct PO--CK 252 252 010 - 0 7 Seek_Error_Rate -OSR-K 252 252 051 - 0 8 Seek_Time_Performance --S--K 252 252 015 - 0 9 Power_On_Hours -O--CK 100 100 000 - 8177 10 Spin_Retry_Count -O--CK 252 252 051 - 0 11 Calibration_Retry_Count -O--CK 100 100 000 - 26 12 Power_Cycle_Count -O--CK 098 098 000 - 2629 191 G-Sense_Error_Rate -O---K 100 100 000 - 502 192 Power-Off_Retract_Count -O---K 252 252 000 - 0 194 Temperature_Celsius -O---- 064 037 000 - 27 (Min/Max 12/63) 195 Hardware_ECC_Recovered -O-RCK 100 100 000 - 0 196 Reallocated_Event_Count -O--CK 252 252 000 - 0 197 Current_Pending_Sector -O--CK 252 252 000 - 0 198 Offline_Uncorrectable ----CK 252 252 000 - 0 199 UDMA_CRC_Error_Count -OS-CK 200 200 000 - 0 200 Multi_Zone_Error_Rate -O-R-K 100 100 000 - 42569 223 Load_Retry_Count -O--CK 100 100 000 - 26 225 Load_Cycle_Count -O--CK 097 097 000 - 35340 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 2 Comprehensive SMART error log 0x03 GPL R/O 2 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 2 Extended self-test log 0x08 GPL R/O 2 Power Conditions log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xc0-0xdf GPL,SL VS 16 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (2 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (2 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 8170 - # 2 Short offline Completed without error 00% 8161 - # 3 Short offline Completed without error 00% 8154 - # 4 Short offline Completed without error 00% 8118 - # 5 Short offline Completed without error 00% 8110 - # 6 Short offline Completed without error 00% 8097 - # 7 Short offline Completed without error 00% 8089 - # 8 Extended offline Completed without error 00% 8084 - # 9 Short offline Completed without error 00% 8077 - #10 Short offline Completed without error 00% 8075 - #11 Short offline Completed without error 00% 8066 - #12 Short offline Completed without error 00% 8052 - #13 Short offline Completed without error 00% 8046 - #14 Short offline Completed without error 00% 8042 - #15 Short offline Completed without error 00% 8035 - SMART Selective self-test log data structure revision number 0 Note: revision number not 1 implies that no selective self-test has ever been run SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Completed [00% left] (0-65535) 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 2 SCT Version (vendor specific): 256 (0x0100) Device State: Active (0) Current Temperature: 27 Celsius Power Cycle Min/Max Temperature: 27/27 Celsius Lifetime Min/Max Temperature: 12/63 Celsius Specified Max Operating Temperature: 80 Celsius Under/Over Temperature Limit Count: 0/0 SCT Temperature History Version: 2 Temperature Sampling Period: 5 minutes Temperature Logging Interval: 5 minutes Min/Max recommended Temperature: -5/80 Celsius Min/Max Temperature Limit: -10/85 Celsius Temperature History Size (Index): 128 (87) Index Estimated Time Temperature Celsius 88 2021-08-17 16:25 27 ******** 89 2021-08-17 16:30 33 ************** ... ..( 43 skipped). .. ************** 5 2021-08-17 20:10 33 ************** 6 2021-08-17 20:15 22 *** 7 2021-08-17 20:20 24 ***** 8 2021-08-17 20:25 26 ******* 9 2021-08-17 20:30 26 ******* 10 2021-08-17 20:35 27 ******** 11 2021-08-17 20:40 29 ********** ... ..( 4 skipped). .. ********** 16 2021-08-17 21:05 29 ********** 17 2021-08-17 21:10 30 *********** ... ..( 6 skipped). .. *********** 24 2021-08-17 21:45 30 *********** 25 2021-08-17 21:50 31 ************ ... ..( 6 skipped). .. ************ 32 2021-08-17 22:25 31 ************ 33 2021-08-17 22:30 32 ************* ... ..( 34 skipped). .. ************* 68 2021-08-18 01:25 32 ************* 69 2021-08-18 01:30 33 ************** 70 2021-08-18 01:35 32 ************* 71 2021-08-18 01:40 32 ************* 72 2021-08-18 01:45 33 ************** 73 2021-08-18 01:50 33 ************** 74 2021-08-18 01:55 33 ************** 75 2021-08-18 02:00 32 ************* 76 2021-08-18 02:05 32 ************* 77 2021-08-18 02:10 33 ************** ... ..( 5 skipped). .. ************** 83 2021-08-18 02:40 33 ************** 84 2021-08-18 02:45 32 ************* ... ..( 2 skipped). .. ************* 87 2021-08-18 03:00 32 ************* Write SCT (Get) Error Recovery Control Command failed: Read of ATA output registers not implemented [JMicron] SCT (Get) Error Recovery Control command failed Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x0002 4 0 R_ERR response for data FIS 0x0003 4 0 R_ERR response for device-to-host data FIS 0x0004 4 0 R_ERR response for host-to-device data FIS 0x0005 4 0 R_ERR response for non-data FIS 0x0006 4 0 R_ERR response for device-to-host non-data FIS 0x0007 4 0 R_ERR response for host-to-device non-data FIS 0x0008 4 0 Device-to-host non-data FIS retries 0x0009 4 1 Transition from drive PhyRdy to drive PhyNRdy 0x000a 4 0 Device-to-host register FISes sent due to a COMRESET 0x000b 4 0 CRC errors within host-to-device FIS 0x000d 4 0 Non-CRC errors within host-to-device FIS 0x000f 4 0 R_ERR response for host-to-device data FIS, CRC 0x0010 4 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 4 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 4 0 R_ERR response for host-to-device non-data FIS, non-CRC 0x8e00 4 0 Vendor specific 0x8e01 4 0 Vendor specific 0x8e02 4 0 Vendor specific 0x8e03 4 0 Vendor specific 0x8e04 4 0 Vendor specific 0x8e05 4 0 Vendor specific 0x8e06 4 0 Vendor specific 0x8e07 4 0 Vendor specific 0x8e08 4 0 Vendor specific 0x8e09 4 0 Vendor specific 0x8e0a 4 0 Vendor specific 0x8e0b 4 0 Vendor specific 0x8e0c 4 0 Vendor specific 0x8e0d 4 0 Vendor specific 0x8e0e 4 0 Vendor specific 0x8e0f 4 0 Vendor specific 0x8e10 4 0 Vendor specific 0x8e11 4 0 Vendor specific