/dev/wd0c smartctl 7.0 2018-12-30 r4883 [i386-unknown-openbsd6.6] (local build) Copyright (C) 2002-18, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Hitachi Travelstar 7K100 Device Model: HTS721060G9AT00 Serial Number: -- Firmware Version: MC3IA51A User Capacity: 60,011,642,880 bytes [60.0 GB] Sector Size: 512 bytes logical/physical Device is: In smartctl database [for details use: -P show] ATA Version is: ATA/ATAPI-6 T13/1410D revision 3a Local Time is: Wed May 6 13:26:22 2020 MSK SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Disabled APM level is: 128 (minimum power consumption without standby) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x80) Offline data collection activity was never started. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 645) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. No General Purpose Logging support. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 35) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate PO-R-- 100 100 062 - 0 2 Throughput_Performance P-S--- 100 100 040 - 0 3 Spin_Up_Time POS--- 172 172 033 - 2 4 Start_Stop_Count -O--C- 100 100 000 - 18 5 Reallocated_Sector_Ct PO--CK 100 100 005 - 0 7 Seek_Error_Rate PO-R-- 100 100 067 - 0 8 Seek_Time_Performance P-S--- 100 100 040 - 0 9 Power_On_Hours -O--C- 100 100 000 - 5 10 Spin_Retry_Count PO--C- 100 100 060 - 0 12 Power_Cycle_Count -O--CK 100 100 000 - 18 191 G-Sense_Error_Rate -O-R-- 100 100 000 - 0 192 Power-Off_Retract_Count -O--CK 100 100 000 - 28442626 193 Load_Cycle_Count -O--C- 100 100 000 - 73 194 Temperature_Celsius -O---- 203 203 000 - 27 (Min/Max 23/45) 196 Reallocated_Event_Count -O--CK 100 100 000 - 37 197 Current_Pending_Sector -O---K 100 100 000 - 0 198 Offline_Uncorrectable ---R-- 100 100 000 - 0 199 UDMA_CRC_Error_Count -O-R-- 200 200 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory not supported SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x06 SL R/O 1 SMART self-test log 0x09 SL R/W 1 Selective self-test log 0x80-0x9f SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log Version: 1 ATA Error Count: 2517 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 2517 occurred at disk power-on lifetime: 3924 hours (163 days + 12 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 01 68 9a de ef Error: IDNF 1 sectors at LBA = 0x0fde9a68 = 266246760 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 ff 01 68 9a de ef 00 00:15:44.100 READ DMA c8 ff 01 67 9a de ef 00 00:15:44.100 READ DMA c8 ff 01 66 9a de ef 00 00:15:44.100 READ DMA c8 ff 01 65 9a de ef 00 00:15:44.000 READ DMA c8 ff 01 64 9a de ef 00 00:15:44.000 READ DMA Error 2516 occurred at disk power-on lifetime: 3924 hours (163 days + 12 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 01 67 9a de ef Error: IDNF 1 sectors at LBA = 0x0fde9a67 = 266246759 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 ff 01 67 9a de ef 00 00:15:44.100 READ DMA c8 ff 01 66 9a de ef 00 00:15:44.100 READ DMA c8 ff 01 65 9a de ef 00 00:15:44.000 READ DMA c8 ff 01 64 9a de ef 00 00:15:44.000 READ DMA c8 ff 01 63 9a de ef 00 00:15:44.000 READ DMA Error 2515 occurred at disk power-on lifetime: 3924 hours (163 days + 12 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 01 66 9a de ef Error: IDNF 1 sectors at LBA = 0x0fde9a66 = 266246758 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 ff 01 66 9a de ef 00 00:15:44.100 READ DMA c8 ff 01 65 9a de ef 00 00:15:44.000 READ DMA c8 ff 01 64 9a de ef 00 00:15:44.000 READ DMA c8 ff 01 63 9a de ef 00 00:15:44.000 READ DMA c8 ff 01 62 9a de ef 00 00:15:43.900 READ DMA Error 2514 occurred at disk power-on lifetime: 3924 hours (163 days + 12 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 01 65 9a de ef Error: IDNF 1 sectors at LBA = 0x0fde9a65 = 266246757 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 ff 01 65 9a de ef 00 00:15:44.000 READ DMA c8 ff 01 64 9a de ef 00 00:15:44.000 READ DMA c8 ff 01 63 9a de ef 00 00:15:44.000 READ DMA c8 ff 01 62 9a de ef 00 00:15:43.900 READ DMA c8 ff 01 61 9a de ef 00 00:15:43.900 READ DMA Error 2513 occurred at disk power-on lifetime: 3924 hours (163 days + 12 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 10 51 01 64 9a de ef Error: IDNF 1 sectors at LBA = 0x0fde9a64 = 266246756 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 ff 01 64 9a de ef 00 00:15:44.000 READ DMA c8 ff 01 63 9a de ef 00 00:15:44.000 READ DMA c8 ff 01 62 9a de ef 00 00:15:43.900 READ DMA c8 ff 01 61 9a de ef 00 00:15:43.900 READ DMA c8 ff 01 60 9a de ef 00 00:15:43.900 READ DMA SMART Extended Self-test Log (GP Log 0x07) not supported SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Aborted by host 90% 4163 - Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum. SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) not supported