Probe #045fbd5e9e of HPE ML10Gen9

Log: smartctl

/dev/ada0 smartctl 7.5 2025-04-30 r5714 [FreeBSD 14.2-RELEASE-p3 amd64] (local build) Copyright (C) 2002-25, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Crucial/Micron RealSSD m4/C400/P400 Device Model: MTFDDAK128MAM-1J1 Serial Number: -- LU WWN Device Id: 5 00a075 ... Firmware Version: 0809 User Capacity: 128,035,676,160 bytes [128 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available, deterministic, zeroed Device is: In smartctl database 7.5/5706 ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 6 SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Thu May 22 14:03:53 2025 UTC SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM level is: 0 (reserved) Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 595) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 9) minutes. Conveyance self-test routine recommended polling time: ( 3) minutes. SCT capabilities: (0x003d) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 100 100 050 - 0 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 100 100 000 - 3785 12 Power_Cycle_Count -O--CK 100 100 000 - 1901 170 Grown_Failing_Block_Ct PO--CK 100 100 010 - 0 171 Program_Fail_Count -O--CK 100 100 000 - 0 172 Erase_Fail_Count -O--CK 100 100 000 - 0 173 Wear_Leveling_Count PO--CK 098 098 010 - 61 174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 0 181 Non4k_Aligned_Access -O---K 100 100 000 - 2427 648 1779 183 SATA_Iface_Downshift -O--CK 100 100 000 - 0 184 End-to-End_Error PO--CK 100 100 050 - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 0 188 Command_Timeout -O--CK 100 100 000 - 0 189 Factory_Bad_Block_Ct -OSR-- 100 100 000 - 88 194 Temperature_Celsius -O---K 100 100 000 - 0 195 Hardware_ECC_Recovered -O-RCK 100 100 000 - 0 196 Reallocated_Event_Count -O--CK 100 100 000 - 0 197 Current_Pending_Sector -O--CK 100 100 000 - 0 198 Offline_Uncorrectable ----CK 100 100 000 - 0 199 UDMA_CRC_Error_Count -OS-CK 100 100 000 - 0 202 Perc_Rated_Life_Used ---RC- 098 098 000 - 2 206 Write_Error_Rate -OSR-- 100 100 000 - 0 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 51 Comprehensive SMART error log 0x03 GPL R/O 16383 Ext. Comprehensive SMART error log 0x04 GPL,SL R/O 255 Device Statistics log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 3449 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x80-0x83 SL R/W 1 Host vendor specific log 0x84-0x9f GPL,SL R/W 16 Host vendor specific log 0xa0 GPL VS 2000 Device vendor specific log 0xa0 SL VS 208 Device vendor specific log 0xa1-0xdf GPL,SL VS 1 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (16383 sectors) No Errors Logged SMART Extended Self-test Log size 3449 not supported SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Status Version: 3 SCT Version (vendor specific): 1 (0x0001) Device State: Active (0) Current Temperature: 0 Celsius Power Cycle Min/Max Temperature: --/ 0 Celsius Lifetime Min/Max Temperature: --/ 0 Celsius SCT Temperature History Version: 2 Temperature Sampling Period: 10 minutes Temperature Logging Interval: 10 minutes Min/Max recommended Temperature: 0/70 Celsius Min/Max Temperature Limit: -5/75 Celsius Temperature History Size (Index): 478 (1) Index Estimated Time Temperature Celsius 2 2025-05-19 06:30 ? - ... ..(464 skipped). .. - 467 2025-05-22 12:00 ? - 468 2025-05-22 12:10 0 - ... ..( 10 skipped). .. - 1 2025-05-22 14:00 0 - SCT Error Recovery Control: Read: 40 (4.0 seconds) Write: 40 (4.0 seconds) Device Statistics (GP Log 0x04) Page Offset Size Value Flags Description 0x01 ===== = = === == General Statistics (rev 2) == 0x01 0x008 4 1901 --- Lifetime Power-On Resets 0x01 0x010 4 3785 --- Power-on Hours 0x01 0x018 6 10018368569 --- Logical Sectors Written 0x01 0x020 6 128029260 --- Number of Write Commands 0x01 0x028 6 13140740529 --- Logical Sectors Read 0x01 0x030 6 243833865 --- Number of Read Commands 0x04 ===== = = === == General Errors Statistics (rev 1) == 0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors 0x04 0x010 4 0 --- Resets Between Cmd Acceptance and Completion 0x05 ===== = = === == Temperature Statistics (rev 1) == 0x05 0x008 1 0 --- Current Temperature 0x05 0x010 1 0 --- Average Short Term Temperature 0x05 0x018 1 0 --- Average Long Term Temperature 0x05 0x020 1 0 --- Highest Temperature 0x05 0x028 1 0 --- Lowest Temperature 0x05 0x030 1 0 --- Highest Average Short Term Temperature 0x05 0x038 1 0 --- Lowest Average Short Term Temperature 0x05 0x040 1 0 --- Highest Average Long Term Temperature 0x05 0x048 1 0 --- Lowest Average Long Term Temperature 0x05 0x050 4 - --- Time in Over-Temperature 0x05 0x058 1 70 --- Specified Maximum Operating Temperature 0x05 0x060 4 - --- Time in Under-Temperature 0x05 0x068 1 0 --- Specified Minimum Operating Temperature 0x06 ===== = = === == Transport Statistics (rev 1) == 0x06 0x008 4 0 --- Number of Hardware Resets 0x06 0x010 4 0 --- Number of ASR Events 0x06 0x018 4 0 --- Number of Interface CRC Errors 0x07 ===== = = === == Solid State Device Statistics (rev 1) == 0x07 0x008 1 4 N-- Percentage Used Endurance Indicator |||_ C monitored condition met ||__ D supports DSN |___ N normalized value Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x000a 4 5 Device-to-host register FISes sent due to a COMRESET


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