Probe #0382eb3cd4 of Intel X79_PLUS Desktop Computer

Log: smartctl

/dev/ada0 smartctl 7.4 2023-08-01 r5530 [FreeBSD 14.2-RELEASE amd64] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Samsung based SSDs Device Model: SAMSUNG MZNLF128HCHP-00004 Serial Number: -- LU WWN Device Id: 5 002538 ... Firmware Version: FXT2301Q User Capacity: 128,035,676,160 bytes [128 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device TRIM Command: Available Device is: In smartctl database 7.3/5528 ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue Dec 10 18:26:07 2024 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 0) seconds. Offline data collection capabilities: (0x53) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 40) minutes. SMART Attributes Data Structure revision number: 1 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 5 Reallocated_Sector_Ct PO--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 097 097 000 - 12226 12 Power_Cycle_Count -O--CK 095 095 000 - 4230 170 Unused_Rsvd_Blk_Ct_Chip -O--CK 100 100 010 - 0 171 Program_Fail_Count_Chip -O--CK 100 100 010 - 0 172 Erase_Fail_Count_Chip -O--CK 100 100 010 - 0 173 Wear_Leveling_Count PO--CK 086 086 005 - 290 174 Unexpect_Power_Loss_Ct -O--CK 099 099 000 - 103 178 Used_Rsvd_Blk_Cnt_Chip PO--C- 100 100 010 - 0 180 Unused_Rsvd_Blk_Cnt_Tot PO--C- 100 100 010 - 1059 184 End-to-End_Error PO--CK 100 100 097 - 0 187 Uncorrectable_Error_Cnt -O--CK 100 100 000 - 0 194 Temperature_Celsius -O--CK 070 042 000 - 30 199 CRC_Error_Count -OSRCK 099 099 000 - 3 233 Media_Wearout_Indicator PO--C- 085 085 000 - 14344518 241 Total_LBAs_Written -O--CK 099 099 000 - 18198 242 Total_LBAs_Read -O--CK 099 099 000 - 25339 249 NAND_Writes_1GiB -O--CK 099 099 000 - 37184 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x01 SL R/O 1 Summary SMART error log 0x02 SL R/O 1 Comprehensive SMART error log 0x03 GPL R/O 1 Ext. Comprehensive SMART error log 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x09 SL R/W 1 Selective self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x13 GPL R/O 1 SATA NCQ Send and Receive log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log 0xdf GPL,SL VS 1 Device vendor specific log 0xe0 GPL,SL R/W 1 SCT Command/Status 0xe1 GPL,SL R/W 1 SCT Data Transfer SMART Extended Comprehensive Error Log Version: 1 (1 sectors) No Errors Logged SMART Extended Self-test Log Version: 1 (1 sectors) No self-tests have been logged. [To run self-tests, use: smartctl -t] Warning! SMART Selective Self-Test Log Structure error: invalid SMART checksum. SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing 255 0 65535 Read_scanning was never started Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 2 0 Command failed due to ICRC error 0x0002 2 0 R_ERR response for data FIS 0x0003 2 0 R_ERR response for device-to-host data FIS 0x0004 2 0 R_ERR response for host-to-device data FIS 0x0005 2 0 R_ERR response for non-data FIS 0x0006 2 0 R_ERR response for device-to-host non-data FIS 0x0007 2 0 R_ERR response for host-to-device non-data FIS 0x0008 2 0 Device-to-host non-data FIS retries 0x0009 2 14 Transition from drive PhyRdy to drive PhyNRdy 0x000a 2 14 Device-to-host register FISes sent due to a COMRESET 0x000b 2 0 CRC errors within host-to-device FIS 0x000d 2 0 Non-CRC errors within host-to-device FIS 0x000f 2 0 R_ERR response for host-to-device data FIS, CRC 0x0010 2 0 R_ERR response for host-to-device data FIS, non-CRC 0x0012 2 0 R_ERR response for host-to-device non-data FIS, CRC 0x0013 2 0 R_ERR response for host-to-device non-data FIS, non-CRC /dev/ada1 smartctl 7.4 2023-08-01 r5530 [FreeBSD 14.2-RELEASE amd64] (local build) Copyright (C) 2002-23, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Model Family: Crucial/Micron Client SSDs Device Model: CT240BX500SSD1 Serial Number: -- LU WWN Device Id: 5 00a075 ... Firmware Version: M6CR054 User Capacity: 240,057,409,536 bytes [240 GB] Sector Size: 512 bytes logical/physical Rotation Rate: Solid State Device Form Factor: 2.5 inches TRIM Command: Available Device is: In smartctl database 7.3/5528 ATA Version is: ACS-3 T13/2161-D revision 4 SATA Version is: SATA 3.3, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is: Tue Dec 10 18:26:07 2024 CET SMART support is: Available - device has SMART capability. SMART support is: Enabled AAM feature is: Unavailable APM feature is: Unavailable Rd look-ahead is: Enabled Write cache is: Enabled DSN feature is: Unavailable ATA Security is: Disabled, frozen [SEC2] Wt Cache Reorder: Unavailable === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x11) SMART execute Offline immediate. No Auto Offline data collection support. Suspend Offline collection upon new command. No Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. No Selective Self-test supported. SMART capabilities: (0x0002) Does not save SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 10) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAGS VALUE WORST THRESH FAIL RAW_VALUE 1 Raw_Read_Error_Rate POSR-K 100 100 000 - 0 5 Reallocate_NAND_Blk_Cnt -O--CK 100 100 010 - 0 9 Power_On_Hours -O--CK 100 100 000 - 2764 12 Power_Cycle_Count -O--CK 100 100 000 - 1214 171 Program_Fail_Count -O--CK 100 100 000 - 0 172 Erase_Fail_Count -O--CK 100 100 000 - 0 173 Ave_Block-Erase_Count -O--CK 097 097 000 - 39 174 Unexpect_Power_Loss_Ct -O--CK 100 100 000 - 232 180 Unused_Reserve_NAND_Blk PO--CK 100 100 000 - 31 183 SATA_Interfac_Downshift -O--CK 100 100 000 - 0 184 Error_Correction_Count -O--CK 100 100 000 - 0 187 Reported_Uncorrect -O--CK 100 100 000 - 0 194 Temperature_Celsius -O---K 074 056 000 - 26 (Min/Max 13/44) 196 Reallocated_Event_Count -O--CK 100 100 000 - 0 197 Current_Pending_ECC_Cnt -O--CK 100 100 000 - 0 198 Offline_Uncorrectable ----CK 100 100 000 - 0 199 UDMA_CRC_Error_Count -O--CK 100 100 000 - 0 202 Percent_Lifetime_Remain ----CK 097 097 001 - 3 206 Write_Error_Rate -OSR-- 100 100 000 - 0 210 Success_RAIN_Recov_Cnt -O--CK 100 100 000 - 0 246 Total_LBAs_Written -O--CK 100 100 000 - 9163982773 247 Host_Program_Page_Count -O--CK 100 100 000 - 286374461 248 FTL_Program_Page_Count -O--CK 100 100 000 - 291834096 249 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 0 250 Read_Error_Retry_Rate -O--CK 100 100 000 - 0 251 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 1265372413 252 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 4 253 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 0 254 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 84 223 Unkn_CrucialMicron_Attr -O--CK 100 100 000 - 6 ||||||_ K auto-keep |||||__ C event count ||||___ R error rate |||____ S speed/performance ||_____ O updated online |______ P prefailure warning General Purpose Log Directory Version 1 SMART Log Directory Version 1 [multi-sector log support] Address Access R/W Size Description 0x00 GPL,SL R/O 1 Log Directory 0x06 SL R/O 1 SMART self-test log 0x07 GPL R/O 1 Extended self-test log 0x10 GPL R/O 1 NCQ Command Error log 0x11 GPL R/O 1 SATA Phy Event Counters log 0x24 GPL R/O 88 Current Device Internal Status Data log 0x30 GPL,SL R/O 9 IDENTIFY DEVICE data log 0x80-0x9f GPL,SL R/W 16 Host vendor specific log SMART Extended Comprehensive Error Log (GP Log 0x03) not supported SMART Error Log not supported SMART Extended Self-test Log Version: 1 (1 sectors) Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 2468 - # 2 Short offline Completed without error 00% 2452 - # 3 Short offline Completed without error 00% 2446 - # 4 Short offline Completed without error 00% 2446 - # 5 Short offline Completed without error 00% 2444 - # 6 Short offline Completed without error 00% 2443 - # 7 Short offline Completed without error 00% 2437 - # 8 Short offline Completed without error 00% 2436 - # 9 Short offline Completed without error 00% 2434 - #10 Short offline Completed without error 00% 2431 - #11 Short offline Completed without error 00% 2428 - #12 Short offline Completed without error 00% 2420 - #13 Short offline Completed without error 00% 2417 - #14 Short offline Completed without error 00% 2416 - #15 Short offline Completed without error 00% 2415 - #16 Short offline Completed without error 00% 2414 - #17 Short offline Completed without error 00% 2407 - #18 Short offline Completed without error 00% 2399 - #19 Short offline Completed without error 00% 2394 - Selective Self-tests/Logging not supported SCT Commands not supported Device Statistics (GP/SMART Log 0x04) not supported Pending Defects log (GP Log 0x0c) not supported SATA Phy Event Counters (GP Log 0x11) ID Size Value Description 0x0001 4 0 Command failed due to ICRC error 0x0002 4 0 R_ERR response for data FIS 0x0005 4 0 R_ERR response for non-data FIS 0x000a 4 14 Device-to-host register FISes sent due to a COMRESET


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